Abstract: A circuit and method for measuring capacitance and capacitance mismatch of at least one capacitor pair are provided. The circuit includes a first switch, a second switch, a third switch and a P-type transistor. A terminal of the first switch is connected to a terminal of a first capacitor, and a terminal of the second switch is connected to a terminal of a second capacitor. A terminal of the third switch is connected to another terminal of the first capacitor and another terminal of the second capacitor, and a gate of the P-type transistor is connected to another terminal of the third switch. When the first, second and third switches are turned on, a capacitance of the first capacitor, a capacitance of the second capacitor, or a capacitance mismatch between the first and second capacitances is measured.

Abstract: A method and apparatus for measuring a delay time is provided. First, a plurality of first/second phase signals, a first/second standard signal, and an inverse signal of the second standard signal are generated. The inverse signal of the second standard signal is applied to a second conductive line close to at least an adjacent conductive line. The first/second standard signal is applied to the first/second conductive line to obtain a first/second transmission signal. Then, the first/second transmission signal is sequentially sampled by the first/second phase signals to sequentially obtain a plurality of first/second sampling results. The first/second sampling results are sequentially identified by a first/second identifying level to obtain a first/second identification result. Accordingly, the delay time between the first and the second transmission signal may be obtained by comparing the different the second and the first identification result.

Abstract: A method and apparatus for measuring a delay time is provided. First, a plurality of first/second phase signals, a first/second standard signal, and an inverse signal of the second standard signal are generated. The inverse signal of the second standard signal is applied to a second conductive line close to at least an adjacent conductive line. The first/second standard signal is applied to the first/second conductive line to obtain a first/second transmission signal. Then, the first/second transmission signal is sequentially sampled by the first/second phase signals to sequentially obtain a plurality of first/second sampling results. The first/second sampling results are sequentially identified by a first/second identifying level to obtain a first/second identification result. Accordingly, the delay time between the first and the second transmission signal may be obtained by comparing the different the second and the first identification result.

Abstract: A circuit and method for measuring capacitance and capacitance mismatch of at least one capacitor pair are provided. The circuit comprises a first switch, a second switch, a third switch and a P-type transistor. A terminal of the first switch is connected to a terminal of a first capacitor, and a terminal of the second switch is connected to a terminal of a second capacitor. A terminal of the third switch is connected to another terminal of the first capacitor and another terminal of the second capacitor, and a gate of the P-type transistor is connected to another terminal of the third switch. When the first, second and third switches are turned on, a capacitance of the first capacitor, a capacitance of the second capacitor, or a capacitance mismatch between the first and second capacitances is measured.