Patents by Inventor Julia Zaks

Julia Zaks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9905410
    Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.
    Type: Grant
    Filed: December 4, 2015
    Date of Patent: February 27, 2018
    Assignee: Agilent Technologies, Inc.
    Inventors: Trygve Ristroph, Julia Zaks
  • Patent number: 9627190
    Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.
    Type: Grant
    Filed: March 27, 2015
    Date of Patent: April 18, 2017
    Assignee: Agilent Technologies, Inc.
    Inventors: Julia Zaks, Trygve Ristroph
  • Publication number: 20160284531
    Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.
    Type: Application
    Filed: March 27, 2015
    Publication date: September 29, 2016
    Inventors: Julia Zaks, Trygve Ristroph
  • Publication number: 20160225602
    Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.
    Type: Application
    Filed: December 4, 2015
    Publication date: August 4, 2016
    Inventors: Trygve Ristroph, Julia Zaks