Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.

Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.

Abstract: An encoder apparatus including a reflective scale and a readhead. The readhead includes at least one light emitting element, at least one sensor and at least one optical device, which together with the scale form an optical system in which the optical device forms an image of an illuminated region of the reflective scale onto the sensor. The system's optical path, from the light emitting element to the sensor, passes through the optical device on its way toward and after reflection from the scale. and includes an unreflected optical path between the light emitting element and the optical device and an unreflected optical path between the optical device and the sensor.

Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.

Abstract: An encoder apparatus including a readhead for reading a reflective scale located adjacent the readhead. The readhead includes a circuit board on which a sensor including one or more photodiodes for detecting light reflected from a scale located adjacent the readhead is mounted, and at least one light emitting element. The light emitting element is mounted to the circuit board via a light emitting element support structure which holds the light emitting element away from the circuit board and the sensing plane of the sensor, and at least a part of which extends over the sensor.

Abstract: A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.

Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.

Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.