Patents by Inventor Julian M. Galvan-Miyoshi

Julian M. Galvan-Miyoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230385586
    Abstract: A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
    Type: Application
    Filed: July 28, 2023
    Publication date: November 30, 2023
    Inventors: Nicolas B. Duarte, Zachary J. Brown, Juan F. Choreno, Julian M. Galvan-Miyoshi, Darin W. Laird, Alejandro Morones Dobarganes, Jose Alberto Olivares Lecona
  • Patent number: 11809933
    Abstract: A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
    Type: Grant
    Filed: August 2, 2022
    Date of Patent: November 7, 2023
    Assignee: PPG Industries Ohio, Inc.
    Inventors: Nicolas B. Duarte, Zachary J. Brown, Juan F. Choreno, Julian M. Galvan-Miyoshi, Darin W. Laird, Alejandro Morones Dobarganes, Jose Alberto Olivares Lecona
  • Publication number: 20220374667
    Abstract: A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
    Type: Application
    Filed: August 2, 2022
    Publication date: November 24, 2022
    Inventors: Nicolas B. Duarte, Zachary J. Brown, Juan F. Choreno, Julian M. Galvan-Miyoshi, Darin W. Laird, Alejandro Morones Dobarganes, Jose Alberto Olivares Lecona
  • Patent number: 11461607
    Abstract: A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: October 4, 2022
    Assignee: PPG Industries Ohio, Inc.
    Inventors: Nicolas B. Duarte, Zachary J. Brown, Juan F. Choreno, Julian M. Galvan-Miyoshi, Darin W. Laird, Alejandro Morones Dobarganes, Jose Alberto Olivares Lecona
  • Publication number: 20220012555
    Abstract: A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.
    Type: Application
    Filed: November 12, 2019
    Publication date: January 13, 2022
    Applicant: PPG Industries Ohio, Inc.
    Inventors: Nicolas B. Duarte, Zachary J. Brown, Juan F. Choreno, Julian M. Galvan-Miyoshi, Darin W. Laird, Alejandro Morones Dobarganes, Jose Alberto Olivares Lecona