Abstract: A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.

Abstract: A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.

Abstract: A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.

Abstract: A system detects and/or predicts metal ion plating events of a metal ion energy storage device. The system includes an optical sensor disposed internally within or externally on a metal ion energy storage device wherein the optical sensor has an optical output that changes in response to strain within a metal ion energy storage device. A current sensor senses current through the metal ion energy storage device. Plating detection circuitry measures a wavelength shift in the optical output of the optical sensor and estimates a state of charge (SOC) of the metal ion energy storage device based on the current. An expected wavelength shift is determined from the estimated SOC. A plating event can be detected and/or predicted based on the difference between the expected wavelength shift and the measured wavelength shift.

Abstract: A system detects and/or predicts metal ion plating events of a metal ion energy storage device. The system includes an optical sensor disposed internally within or externally on a metal ion energy storage device wherein the optical sensor has an optical output that changes in response to strain within a metal ion energy storage device. A current sensor senses current through the metal ion energy storage device. Plating detection circuitry measures a wavelength shift in the optical output of the optical sensor and estimates a state of charge (SOC) of the metal ion energy storage device based on the current. An expected wavelength shift is determined from the estimated SOC. A plating event can be detected and/or predicted based on the difference between the expected wavelength shift and the measured wavelength shift.

Abstract: A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.