Abstract: A fixture assembly is presented. The fixture assembly includes a device assembly for mating with a device under test and a tester interface assembly for mating with the device assembly on one side and a tester on a second side. In the method and apparatus of the present invention, the device assembly includes a probe field specific to a device under test and may be changed to accommodate a different device, without changing the tester interface assembly. The tester interface assembly includes a frame used for alignment and structural support. The frame interfaces with a probe plate on one side and a load plate on the other side. The probe plate holds a plurality of probes in place while the load plate provides a plurality of holes for the probes to extend downward through the load plate. A printed circuit board (PCB) is positioned below the load plate and makes contact with the ends of the probes.

Abstract: The present invention is directed to a method and apparatus for balancing forces in a fixture and reducing forces in a probe plate (208) housed in the fixture. A plurality of double-ended probes (200) are positioned in the probe plate (208). A first bit (216), located at one of the double-ended probe (200) is in contact with a board under test (206). A second bit (218), which is oppositely disposed and located on the other end of the double-ended probe (200) is in contact with a wireless PCB (202). A spring (220) runs the length of the double-ended probe (200) and is in contact with the first bit (216) and the second bit (218).

Abstract: The present invention is directed to a method and apparatus for balancing forces in a fixture and reducing forces in a probe plate housed in the fixture. A plurality of double-ended probes are positioned in the probe plate. A first bit, located at one of the double-ended probe is in contact with a board under test. A second oppositely disposed bit located on the other end of the double-ended probe is in contact with a wireless PCB. A spring runs the length of the double-ended probe and is in contact with the first bit and the second bit. As downward forces are applied from the board under test and upward forces are applied from the wireless PCB, the bits move downward and upward respectively and the spring compresses, alleviating/reducing forces in the probe plate.

Abstract: A fixture assembly is presented. The fixture assembly includes a device assembly for mating with a device under test and a tester interface assembly for mating with the device assembly on one side and a tester on a second side. In the method and apparatus of the present invention, the device assembly includes a probe field specific to a device under test and may be changed to accommodate a different device, without changing the tester interface assembly. The tester interface assembly includes a frame used for alignment and structural support. The frame interfaces with a probe plate on one side and a load plate on the other side. The probe plate holds a plurality of probes in place while the load plate provides a plurality of holes for the probes to extend downward through the load plate. A printed circuit board (PCB) is positioned below the load plate and makes contact with the ends of the probes.