Abstract: A Tamm electromagnetic cavity (10, 20, 30, 40, 60) possessing a resonant frequency in the THz domain, comprising: an interference mirror that is reflective in the THz domain, this mirror consisting of a stack of dielectric layers (7) comprising an alternation, in a z-direction, of two different layers, a layer referred to as the layer of high refractive index (2) and a layer referred to as the layer of low refractive index (4), the index of the layer of low refraction being lower than that of the layer of high refractive index, and being manufactured by stacking layers mechanically or by joining dielectric layers to one another; an upper metal layer (5) deposited on or added to an upper dielectric layer of said interference mirror so as to form a structure that supports at least one Tamm mode in the THz domain, the upper metal layer (5) being structured so as to form an antenna possessing a resonant frequency equal to that of the electromagnetic cavity.

Abstract: A method for characterizing an electric signal (10), includes the propagation of a first light beam (18) through an electro-optical medium (17) in a first propagation direction, wherein at least one optical property of the medium changes when it is submitted to an electrical field, and the propagation of a second light beam (19) through the electro-optical medium in a second propagation direction different from the first direction. For each light beam, a measurement of a variation in an optical property of the light beam (18; 19) due to the propagation of the beam in the medium (17) is used for determining the propagation direction (20) of an electric signal (10) submitting the medium to an electrical field. A device for implementing the method, and an electro-optical probe implemented in the device are also disclosed. Applicability: electro-optical sampling of a component, characterization of electric pulses in guided structures.

Abstract: A method for characterising an electric signal (10), includes the propagation of a first light beam (18) through an electro-optical medium (17) in a first propagation direction, wherein at least one optical property of the medium changes when it is submitted to an electrical field, and the propagation of a second light beam (19) through the electro-optical medium in a second propagation direction different from the first direction. For each light beam, a measurement of a variation in an optical property of the light beam (18; 19) due to the propagation of the beam in the medium (17) is used for determining the propagation direction (20) of an electric signal (10) submitting the medium to an electrical field. A device for implementing the method, and an electro-optical probe implemented in the device are also disclosed. Applicability: electro-optical sampling of a component, characterisation of electric pulses in guided structures.