Abstract: A switch has a channel plate that defines at least a portion of a number of cavities. A switching fluid is held within one or more of the cavities, and is movable between at least first and second switch states in response to forces that are applied to the switching fluid. A plurality of planar signal conductors extend from edges of the switch to within the one or more cavities holding the switching fluid, and are in wetted contact with the switching fluid. Corners in paths of the planar signal conductors may be limited to greater than 90°, about 135°, or equal to or greater than 135°. In one embodiment, signal path corners are so limited, but the planar signal conductors do not extend to the edges of the switch. In another embodiment, the one or more cavities holding the switching fluid are at least partly defined by a bent switching fluid channel.

Abstract: A switch having first and second mated substrates that define therebetween first and second intersecting channels of a bent switching fluid cavity. A switching fluid is held within the bent switching fluid cavity and is movable between first and second switch states in response to forces that are applied to the switching fluid. More of the switching fluid is forced into the first of the intersecting channels in the first switch state, and more of the switching fluid is forced into the second of the intersecting channels in the second switch state.

Abstract: A switch having first and second mated substrates that define therebetween first and second intersecting channels of a bent switching fluid cavity. A switching fluid is held within the bent switching fluid cavity and is movable between first and second switch states in response to forces that are applied to the switching fluid. More of the switching fluid is forced into the first of the intersecting channels in the first switch state, and more of the switching fluid is forced into the second of the intersecting channels in the second switch state.

Abstract: A switch has a channel plate that defines at least a portion of a number of cavities. A switching fluid is held within one or more of the cavities, and is movable between at least first and second switch states in response to forces that are applied to the switching fluid. A plurality of planar signal conductors extend from edges of the switch to within the one or more cavities holding the switching fluid, and are in wetted contact with the switching fluid. Corners in paths of the planar signal conductors may be limited to greater than 90°, about 135°, or equal to or greater than 135°. In one embodiment, signal path corners are so limited, but the planar signal conductors do not extend to the edges of the switch. In another embodiment, the one or more cavities holding the switching fluid are at least partly defined by a bent switching fluid channel.

Abstract: Asymmetric support for high frequency transmission lines. An asymmetrical support structure coaxially supports a center conductor over a ground plane using a dielectric material. Absorbing material between the dielectric and the outer conductor reduces the effects of high order modes.

Abstract: A connector assembly includes a first connector half, and a second. The first connector half includes a first transmission line, having a first outer conductor and a first center conductor. The first center conductor has a first end that has an angled flat region. The second connector half, includes a second transmission line. The second transmission line includes a second outer conductor and a second center conductor. The second center conductor has a first end that has an angled flat region. When the first connector half and the second connector half are connected together, the first outer conductor is electrically connected to the second outer conductor. Additionally, a wiping contact is established between the angled flat region of the first end of the first center conductor and the angled flat region of the first end of the second center conductor.

Abstract: A connector assembly includes a first connector half, and a second. The first connector half includes a first transmission line, having a first outer conductor and a first center conductor. The first center conductor has a first end that has an angled flat region. The second connector half, includes a second transmission line. The second transmission line includes a second outer conductor and a second center conductor. The second center conductor has a first end that has an angled flat region. When the first connector half and the second connector half are connected together, the first outer conductor is electrically connected to the second outer conductor. Additionally, a wiping contact is established between the angled flat region of the first end of the first center conductor and the angled flat region of the first end of the second center conductor.

Abstract: A compressible conductive interface provides electrical continuity between a first group of contacts and a second group of contacts in the presence of a compression force applied between the groups of contacts. An insulating housing in the compressible conductive interface has one or more channels and a matrix of apertures. Compressible bars in the compressible conductive interface each have a pair of opposing sides, a base and a nose and are positioned in the channels so that the nose of the compressible bar is at a bottom of the channel into which the compressible bar is positioned. A series of conductive elements, each having a conductive frame and a conductive slider, are also included in the compressible conductive interface. Each conductive element of the compressible conductive interface has a neutral state and a loaded state.

Abstract: The invention provides a balun capable of operation over a range including micro and millimeter wavelengths. The balun includes a set of ferrite beads, and a set of polyiron cones. The ferrite beads and polyiron cones together provide signal balancing operable across a bandwidth together provide a signal balancing operable across a range of bandwidths of about 5000 to 1.

Abstract: A compliant wafer prober docking adapter provide compliant docking capability which permits a test head to be floated (to come down) to the top portion of the compliant adapter. The compliant adapter includes a compliant spring mechanism in the form of coiled springs which support a portion of the weight of the test head and wherein the upper portion of the adapter automatically aligns itself with the test head. This desirable aspect allows for all of the connectors to be seated properly, such that the locking of a cam locking mechanism provides a compliant and secure mating between the two surfaces. Also, a test head can be easily moved from one wafer prober to another, because the alignment of the adapter to the wafer is not being disturbed.

Abstract: An electronic circuit tester for measuring the response to electrical signals applied to an electronic circuit under test is provided with a socket for effecting connection between a packaged device or integrated circuit being tested to a device-under-test (DUT) board incorporated into a fixture board of the tester.

Abstract: An electronic circuit tester for measuring the response of electrical signals applied to an electronic circuit under test is provided with a blind mate connector for effecting connection between a test head of the electronic circuit tester and a calibration board or, alternatively, a fixture board coupled to an electronic circuit under test. The blind mate connector includes a body portion having a relieved region at one end, a coaxial center conductor, dielectric material disposed in an interstitial region for supporting the center conductor within the body portion, a coaxial sleeve disposed in the relieved region in electrical contact with the body portion, and a ring to retain the sleeve in the body portion. The blind mate connector is mounted to the calibration or fixture board and mates with a compliant female connector incorporated into the test head.

Abstract: An electronic circuit test system for measuring the response to electrical signals applied to an electronic circuit under test is provided with a docking system for facilitating mechanical and electrical connections. A docking cone is mounted to a fixture board of the electronic circuit test system. The docking cone enters a tunnel in a test head of the electronic circuit test system as the fixture board is moved toward the test head. The docking cone guides connectors mounted to the fixture board into connection with mating connectors mounted to a load board and a connector support disk comprising the test head. The docking system increases the repeatability and reliability of mechanical and electrical connections and reduces the risk of damage to electrical connectors of the electronic circuit test system.

Abstract: An electronic circuit tester for measuring the response of electrical signals applied to an electronic circuit under test is provided with a pivotable connection for conduit through which cables are routed from a test head coupled to the electronic circuit under test to the remainder of the tester. The test head includes a chassis having a relieved region in which a bracket is selectively mounted. The bracket has first and second legs disposed at a distance from one another, the first and second legs each being provided with an approximately circular hole to provide a bearing surface for pivotable movement. A fitting having first and second approximately tubular arms extending outwardly from an integral transversely depending conduit portion is connected to the chassis with each of the first and second arms rotatably captured in the holes of the respective first and second legs of the bracket when the bracket is mounted to the chassis.

Abstract: An electronic circuit tester for measuring the response of electrical signals applied to an electronic circuit under test is provided with a calibration board for effecting calibration of the tester to the plane of connectors incorporated into a test head of the tester. The calibration board includes a dielectric substrate, calibration standards, such as opens, shorts, and loads, mounted to the substrate in respective regions of the substrate, connectors for electrically connecting the calibration standards to the connectors of the test head when the calibration board is selectively substituted for a fixture board, structure for mounting the calibration board to the test head so that electrical connection is established between the calibration board and the test head, and indicia on the calibration board and the test head for indicating a sequence of rotational positions of the calibration board for calibration of the tester using the calibration standards.

Abstract: A female contact having a shell that encloses a collet that has an opening in a first end of the collet and that has a second end that is configured so that, when a male pin is inserted through the first end of the collet, it pushes on the second end of the collet either directly or indirectly through some mechanism such as a spring. This female contact has a small diameter that makes it particularly suitable for certain applications and in some embodiments extends outward from the shell to facilitate inserting a male pin into the collet.

Abstract: A wide bandwidth R. F. vector bridge is provided which is made up of a housing and a microcircuit contained therein. The microcircuit includes a substrate having two opposing faces, and a patterned layer of conductive material on each face defining a reflection port area, a reference port area, and a test port area. A first impedance means provides a first impedance between the reflection port area and the reference port area, and a second impedance means provides a second impedance between the reflection port area and the test port area. Also included are a reflection port means for coupling the reflection port area to other electrical components, a reference port means for coupling the reference port area to a reference load, and a test port means for coupling the test port area to a device under test.

Abstract: Provided is a design for a terminated R.F./microwave Wheatstone bridge and a precision termination which can be used therewith.