Patents by Inventor Jumpei ANDO
Jumpei ANDO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240094092Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data.Type: ApplicationFiled: February 28, 2023Publication date: March 21, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Wataru WATANABE, Keisuke KAWAUCHI, Takayuki ITOH, Jumpei ANDO, Toshiyuki ONO
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Publication number: 20240094091Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.Type: ApplicationFiled: February 22, 2023Publication date: March 21, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Wataru WATANABE, Keisuke KAWAUCHI, Takayuki ITOH, Jumpei ANDO, Toshiyuki ONO
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Publication number: 20240085899Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.Type: ApplicationFiled: February 28, 2023Publication date: March 14, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Jumpei ANDO, Wataru WATANABE, Takayuki ITOH, Keisuke KAWAUCHI, Toshiyuki ONO
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Patent number: 11782426Abstract: An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.Type: GrantFiled: February 26, 2021Date of Patent: October 10, 2023Assignee: KABUSHIKI KAISHA TOSHIBAInventors: Jumpei Ando, Wataru Watanabe, Takayuki Itoh, Toshiyuki Ono
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Patent number: 11775512Abstract: According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.Type: GrantFiled: August 31, 2021Date of Patent: October 3, 2023Assignee: Kabushiki Kaisha ToshibaInventors: Wataru Watanabe, Takayuki Itoh, Jumpei Ando, Keisuke Kawauchi, Toshiyuki Ono
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Publication number: 20230244210Abstract: In general, according to one embodiment, a data processing apparatus includes a processor including hardware. The processor acquires state data related to a state of each product and order data related to order related to manufacturing of each product. The processor calculates a first score by using the acquired state data and the acquired order data. The first score regards a change in the acquired state data and is based on a first change model. The first change model represents the change in the state data using the order data. The processor outputs the first score.Type: ApplicationFiled: August 31, 2022Publication date: August 3, 2023Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Keisuke KAWAUCHI, Takayuki ITOH, Wataru WATANABE, Jumpei ANDO, Toshiyuki ONO
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Publication number: 20230081798Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires a data element group composed of a plurality of data elements, calculates, in regard to a first data element in the data element group, an index value indicative of a conditional dispersion from another data element in the data element group, extracts, based on the index value, a parent element having a high association with the first data element from the data element group, and outputs an analysis result including first information relating to the first data element and the parent element.Type: ApplicationFiled: February 25, 2022Publication date: March 16, 2023Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Takayuki ITOH, Wataru WATANABE, Jumpei ANDO, Keisuke KAWAUCHI, Toshiyuki ONO
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Publication number: 20230055892Abstract: A data processing apparatus includes a processor. The processor generates visualization data for displaying estimation results of manufacturing conditions based on estimation results and relationship data. The relationship data includes first relationship data as a relationship between first manufacturing conditions recorded during an analysis, and second relationship data as a relationship between second manufacturing conditions corresponding. The processor divides the estimation results of the manufacturing conditions into a first group based on the first relationship data, and into a second group based on the second relationship data. The processor generates the visualization data based on a change in manufacturing condition relationship between the first group and the second group.Type: ApplicationFiled: February 28, 2022Publication date: February 23, 2023Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Wataru WATANABE, Takayuki ITOH, Jumpei ANDO, Keisuke KAWAUCHI, Toshiyuki ONO
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Patent number: 11436769Abstract: A visualized data generation device includes an acquisitor, an analyzer, and a generator. The acquisitor acquires manufacturing data including one or more pieces of first data Yi regarding a product state with respect to one product. The analyzer analyzes the first data Yi acquired by the acquisitor and derives a first index value with respect to each piece of the first data Yi. The generator generates visualized data including a first analysis result display region for causing a display device to display information about the first index value. The generator generates the visualized data in which an amount of information and a priority is set for each first analysis result display region on the basis of the first index value and a display form of the first analysis result display region is set on the basis of the amount of information and the priority.Type: GrantFiled: September 3, 2020Date of Patent: September 6, 2022Assignee: Kabushiki Kaisha ToshibaInventors: Wataru Watanabe, Jumpei Ando, Takayuki Itoh, Toshiyuki Ono
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Publication number: 20220188307Abstract: According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.Type: ApplicationFiled: August 31, 2021Publication date: June 16, 2022Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Wataru Watanabe, Takayuki Itoh, Jumpei Ando, Keisuke Kawauchi, Toshiyuki Ono
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Publication number: 20220083033Abstract: An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.Type: ApplicationFiled: February 26, 2021Publication date: March 17, 2022Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Jumpei ANDO, Wataru WATANABE, Takayuki ITOH, Toshiyuki ONO
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Publication number: 20210134032Abstract: A visualized data generation device includes an acquisitor, an analyzer, and a generator. The acquisitor acquires manufacturing data including one or more pieces of first data Yi regarding a product state with respect to one product. The analyzer analyzes the first data Yi acquired by the acquisitor and derives a first index value with respect to each piece of the first data Yi. The generator generates visualized data including a first analysis result display region for causing a display device to display information about the first index value. The generator generates the visualized data in which an amount of information and a priority is set for each first analysis result display region on the basis of the first index value and a display form of the first analysis result display region is set on the basis of the amount of information and the priority.Type: ApplicationFiled: September 3, 2020Publication date: May 6, 2021Applicant: Kabushiki Kaisha ToshibaInventors: Wataru WATANABE, Jumpei ANDO, Takayuki ITOH, Toshiyuki ONO