Patents by Inventor Jun Bak

Jun Bak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240176245
    Abstract: A patterning method includes: forming a first photoresist layer on a substrate; performing first divisional exposure on the first photoresist layer with first exposure energy, higher than or equal to threshold energy, using a reticle having lines and spaces of a mask pattern and an exposure apparatus; and shifting the reticle below a line width of the mask pattern and performing second divisional exposure on the first photoresist layer with second exposure energy, higher than or equal to the threshold energy, using the reticle to form a photoresist pattern. A spatial distribution of the first exposure energy may overlap a spatial distribution of the second exposure energy.
    Type: Application
    Filed: February 7, 2024
    Publication date: May 30, 2024
    Inventors: Jungchul SONG, Min Jun BAK, Wan-Gyu LEE, Jong-Wan PARK
  • Publication number: 20230029310
    Abstract: An exemplary embodiment in the present disclosure provides a grain-oriented electrical steel sheet containing, by wt %: 3.0 to 4.5% of Si; 0.05 to 0.2% of Mn; 0.015 to 0.035% of Al; 0.0015% or less (excluding 0%) of C; 0.0015% or less (excluding 0%) of N; 0.0015% or less (excluding 0%) of S; and a balance of Fe and other unavoidable impurities, wherein the grain-oriented electrical steel sheet satisfies the following Relational Expressions 1 and 2: (W13/50/W17/50)?0.57??[Relational Expression 1] (W15/50/W17/50)?0.76??[Relational Expression 2] where Wx/y represents a core loss value under conditions in which a magnitude of an applied magnetic field is x/10 T and a frequency is y Hz.
    Type: Application
    Filed: December 15, 2020
    Publication date: January 26, 2023
    Applicant: POSCO
    Inventors: Chang-Soo Park, Kyu-Seok Han, Jin-Wook Seo, Yu-Jun Bak
  • Patent number: 11241732
    Abstract: A method of casting a casting product having tubular flow passages includes: attaching a cast-in pipe insert, having outer and inner fixing members to which both ends of pipes are coupled, respectively, to a fixed mold; assembling a movable mold with the fixed mold; injecting a molten metal into a cavity defined inside the fixed and movable molds; ejecting a casting product from the assembled molds after injecting the molten metal; and removing the outer and inner fixing members from the casting product.
    Type: Grant
    Filed: November 26, 2019
    Date of Patent: February 8, 2022
    Assignees: Hyundai Motor Company, Kia Motors Corporation, Sambo Motors Co Ltd
    Inventors: Yoon-Ki Lee, Hyung-Sop Yoon, Cheol-Ung Lee, Jae-Gi Sim, Jun Bak, Sang-Muk Park, Sung-Chun Jang, Jin-Hee Lee, Young-Han No, Young-Jae Do
  • Publication number: 20200353534
    Abstract: A method of casting a casting product having tubular flow passages includes: attaching a cast-in pipe insert, having outer and inner fixing members to which both ends of pipes are coupled, respectively, to a fixed mold; assembling a movable mold with the fixed mold; injecting a molten metal into a cavity defined inside the fixed and movable molds; ejecting a casting product from the assembled molds after injecting the molten metal; and removing the outer and inner fixing members from the casting product.
    Type: Application
    Filed: November 26, 2019
    Publication date: November 12, 2020
    Inventors: Yoon-Ki LEE, Hyung-Sop YOON, Cheol-Ung LEE, Jae-Gi SIM, Jun BAK, Sang-Muk PARK, Sung-Chun JANG, Jin-Hee LEE, Young-Han NO, Young-Jae DO
  • Publication number: 20060126786
    Abstract: Disclosed are an apparatus and a method for simultaneously measuring integrated reflectivity of X-rays with different orders of reflections in crystal. Continuous X-rays are incident into the crystal and reflection intensities of the X-rays reflected from the crystal with different orders of reflections are measured based on Bragg's law, thereby measuring reflectivity of X-rays with different orders of reflections.
    Type: Application
    Filed: July 8, 2005
    Publication date: June 15, 2006
    Inventors: Sang Lee, Jun Bak, Manfred Bitter