Patents by Inventor Jun-Bin YEH

Jun-Bin YEH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11193816
    Abstract: An embodiment of an equipment health state monitoring method adapted to monitor an equipment having a monitored part, including: obtaining a plurality of first values of the monitored part from a sensor in a first time period; extracting a plurality of first parameters from the first values; generating an equipment health state index model according to the first parameters; obtaining a plurality of second value from the sensor in a second time period after the first time period; extracting a plurality of second parameters from the second values; generating a plurality of equipment health state indices according to the second parameters and the equipment health state index model; generating a health state control chart according to the equipment health state indices; and determining whether each of the equipment health state indices locates in an alert area of the health state control chart and outputting a determination result accordingly.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: December 7, 2021
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chi-Chun Hsia, Wan-Jung Chang, Jun-Bin Yeh
  • Patent number: 10635741
    Abstract: A method and a system for analyzing a plurality of process factors affecting the trend of a continuous process are provided. The method includes the following steps: A plurality of similar time periods are selected from a time series. The trend of the continuous process in each of the similar time periods is similar to the trend of the continuous process in a current time period. A contribution of each of the process factors corresponding a monitoring target is analyzed according to the process factor values in the similar time periods and a plurality of monitor target values of the monitoring target. Part of the process factors are picked out according to the contributions.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: April 28, 2020
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chi-Chun Hsia, Jun-Bin Yeh, Li-Jie Chen, Ya-Chu Chuang
  • Publication number: 20200116553
    Abstract: An embodiment of an equipment health state monitoring method adapted to monitor an equipment having a monitored part, including: obtaining a plurality of first values of the monitored part from a sensor in a first time period; extracting a plurality of first parameters from the first values; generating an equipment health state index model according to the first parameters; obtaining a plurality of second value from the sensor in a second time period after the first time period; extracting a plurality of second parameters from the second values; generating a plurality of equipment health state indices according to the second parameters and the equipment health state index model; generating a health state control chart according to the equipment health state indices; and determining whether each of the equipment health state indices locates in an alert area of the health state control chart and outputting a determination result accordingly.
    Type: Application
    Filed: December 27, 2018
    Publication date: April 16, 2020
    Inventors: Chi-Chun HSIA, Wan-Jung CHANG, Jun-Bin YEH
  • Publication number: 20180143943
    Abstract: A method and a system for analyzing a plurality of process factors affecting the trend of a continuous process are provided. The method includes the following steps: A plurality of similar time periods are selected from a time series. The trend of the continuous process in each of the similar time periods is similar to the trend of the continuous process in a current time period. A contribution of each of the process factors corresponding a monitoring target is analyzed according to the process factor values in the similar time periods and a plurality of monitor target values of the monitoring target. Part of the process factors are picked out according to the contributions.
    Type: Application
    Filed: August 24, 2017
    Publication date: May 24, 2018
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chi-Chun HSIA, Jun-Bin YEH, Li-Jie CHEN, Ya-Chu CHUANG