Patents by Inventor Jun FUJISAKI

Jun FUJISAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240086756
    Abstract: An information processing apparatus determines a combination of a first data qubit and a second data qubit that further reduces the energy represented by an energy equation. The energy equation includes first to third energy terms. The first energy term is used to identify the first data qubit on which a Z error has occurred. The second energy term is used to identify the second data qubit on which an X error has occurred. The third energy term reduces the energy as the number of data qubits each being a third data qubit on which both a Z error and an X error have simultaneously occurred increases. The information processing apparatus determines that a Y error has occurred on the third data qubit.
    Type: Application
    Filed: July 27, 2023
    Publication date: March 14, 2024
    Applicants: Fujitsu Limited, OSAKA UNIVERSITY
    Inventors: Jun FUJISAKI, Hirotaka OSHIMA, Keisuke FUJII
  • Patent number: 11555866
    Abstract: A measurement apparatus includes: a memory; and a processor coupled to the memory and configured to: acquire, for each of two samples which are objects made of a same material, have different sizes, and have similar shapes, magnetization curve data measured for the sample and a shape parameter including a dimension of the sample; calculate magnetization of an inner part of each of the samples based on the acquired magnetization curve data and shape parameter of the sample by using a model representing magnetization of the object by separating the magnetization of the object into a magnetization component of a surface part and a magnetization component of an inner part of the object in accordance with a volume ratio between the surface part and the inner part of the object; and output the calculated result.
    Type: Grant
    Filed: August 30, 2021
    Date of Patent: January 17, 2023
    Assignee: FUJITSU LIMITED
    Inventors: Minoru Hoshina, Jun Fujisaki
  • Patent number: 11531074
    Abstract: A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the d
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: December 20, 2022
    Assignee: Fujitsu Limited
    Inventors: Minoru Hoshina, Jun Fujisaki
  • Publication number: 20220236343
    Abstract: A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the d
    Type: Application
    Filed: September 16, 2021
    Publication date: July 28, 2022
    Applicant: FUJITSU LIMITED
    Inventors: Minoru Hoshina, Jun FUJISAKI
  • Publication number: 20220179014
    Abstract: A measurement apparatus includes: a memory; and a processor coupled to the memory and configured to: acquire, for each of two samples which are objects made of a same material, have different sizes, and have similar shapes, magnetization curve data measured for the sample and a shape parameter including a dimension of the sample; calculate magnetization of an inner part of each of the samples based on the acquired magnetization curve data and shape parameter of the sample by using a model representing magnetization of the object by separating the magnetization of the object into a magnetization component of a surface part and a magnetization component of an inner part of the object in accordance with a volume ratio between the surface part and the inner part of the object; and output the calculated result.
    Type: Application
    Filed: August 30, 2021
    Publication date: June 9, 2022
    Applicant: FUJITSU LIMITED
    Inventors: Minoru Hoshina, Jun FUJISAKI
  • Patent number: 10794966
    Abstract: A device includes a memory that stores a measurement-result of a first magnetization of a permanent-magnet corresponding to an external-magnetic field in an open-magnetic circuit; and a processor to divide the permanent-magnet into meshes, generate a function based on the measurement-result, the function indicating a second magnetization corresponding to the external-magnetic field in a closed-magnetic circuit, the function including a parameter having a value, calculate a diamagnetic-field corresponding to the external-magnetic field based on the second magnetization for each of the meshes, calculate a third magnetization of the permanent-magnet, calculate an average of the third magnetizations, calculate an error between the first magnetization and the calculated average, correct the value of the parameter, and repeat the calculation of the second magnetization, the diamagnetic-field, the third magnetizations, the average, and the error, and the correction of the value of the parameter until the error falls
    Type: Grant
    Filed: April 25, 2019
    Date of Patent: October 6, 2020
    Assignee: FUJITSU LIMITED
    Inventors: Jun Fujisaki, Atsushi Furuya, Hideyuki Shitara
  • Publication number: 20190377033
    Abstract: A device includes: a memory that stores a measurement-result of a first magnetization of a permanent-magnet corresponding to an external-magnetic field in an open-magnetic circuit; and a processor to divide the permanent-magnet into meshes, generate a function based on the measurement-result, the function indicating a second magnetization corresponding to the external-magnetic field in a closed-magnetic circuit, the function including a parameter having a value, calculate a diamagnetic-field corresponding to the external-magnetic field based on the second magnetization for each of the meshes, calculate a third magnetization of the permanent-magnet, calculate an average of the third magnetizations, calculate an error between the first magnetization and the calculated average, correct the value of the parameter, and repeat the calculation of the second magnetization, the diamagnetic-field, the third magnetizations, the average, and the error, and the correction of the value of the parameter until the error fall
    Type: Application
    Filed: April 25, 2019
    Publication date: December 12, 2019
    Applicant: FUJITSU LIMITED
    Inventors: Jun FUJISAKI, Atsushi Furuya, Hideyuki Shitara
  • Patent number: 10467184
    Abstract: A parallel processing apparatus includes: processors; and a network switch, wherein a first processor: generates divided matrix data by dividing the matrix data in such a manner that an overlapping portion is present with each other; transmits the divided matrix data to a second processor; generates first evaluation-value matrix data from the divided matrix data; transmits, to the second processor, first elements in a first overlapping portion of the first evaluation-value matrix data; receives, from the second processor, second elements of a second overlapping portion of second evaluation-value matrix data; calculates first added evaluation data by adding the second elements to the first elements; transmits the first added evaluation data to the second processor; receives, from the second processor, second added evaluation data; and calculates a first C point or a first F point based on the first evaluation-value matrix data which is updated using the second added evaluation data.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: November 5, 2019
    Assignee: FUJITSU LIMITED
    Inventors: Jun Fujisaki, Ryoji Tandokoro, Akira Hosoi, Hideyuki Shitara
  • Publication number: 20180349316
    Abstract: A parallel processing apparatus includes: processors; and a network switch, wherein a first processor: generates divided matrix data by dividing the matrix data in such a manner that an overlapping portion is present with each other; transmits the divided matrix data to a second processor; generates first evaluation-value matrix data from the divided matrix data; transmits, to the second processor, first elements in a first overlapping portion of the first evaluation-value matrix data; receives, from the second processor, second elements of a second overlapping portion of second evaluation-value matrix data; calculates first added evaluation data by adding the second elements to the first elements; transmits the first added evaluation data to the second processor; receives, from the second processor, second added evaluation data; and calculates a first C point or a first F point based on the first evaluation-value matrix data which is updated using the second added evaluation data.
    Type: Application
    Filed: May 31, 2018
    Publication date: December 6, 2018
    Applicant: FUJITSU LIMITED
    Inventors: Jun FUJISAKI, Ryoji TANDOKORO, Akira HOSOI, Hideyuki Shitara
  • Patent number: 10146894
    Abstract: A magnetization vector storing method includes: acquiring, by a computer, a saturation magnetization value of a material to be simulated from a database indicating the saturation magnetization value of each material; dividing each component of a magnetization vector indicating a magnetization state of the material to be simulated by the saturation magnetization value; and converting each component of the magnetization vector obtained after the dividing using the saturation magnetization into an integer value and storing the integer value in a storage unit.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: December 4, 2018
    Assignee: FUJITSU LIMITED
    Inventors: Jun Fujisaki, Koichi Shimizu
  • Publication number: 20180107773
    Abstract: An information processing apparatus compares threshold values based on distance data indicating distances between a plurality of nodes in a first mesh model with coefficient values corresponding to a plurality of pairs of nodes in the first matrix data, and updates at least some of evaluation values corresponding to the nodes on the basis of a comparison result. The information processing apparatus generates second matrix data of a second mesh model created by excluding some of the nodes selected on the basis of the evaluation values from the first mesh model. Then, the information processing apparatus calculates a solution of a plurality of variables associated with the nodes, by using the first matrix data and the second matrix data.
    Type: Application
    Filed: August 29, 2017
    Publication date: April 19, 2018
    Applicant: FUJITSU LIMITED
    Inventors: Jun FUJISAKI, Koichi Shimizu
  • Publication number: 20160196372
    Abstract: A magnetization vector storing method includes: acquiring, by a computer, a saturation magnetization value of a material to be simulated from a database indicating the saturation magnetization value of each material; dividing each component of a magnetization vector indicating a magnetization state of the material to be simulated by the saturation magnetization value; and converting each component of the magnetization vector obtained after the dividing using the saturation magnetization into an integer value and storing the integer value in a storage unit.
    Type: Application
    Filed: November 18, 2015
    Publication date: July 7, 2016
    Applicant: FUJITSU LIMITED
    Inventors: Jun FUJISAKI, Koichi SHIMIZU