Patents by Inventor Jun FUJISAKI
Jun FUJISAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240086756Abstract: An information processing apparatus determines a combination of a first data qubit and a second data qubit that further reduces the energy represented by an energy equation. The energy equation includes first to third energy terms. The first energy term is used to identify the first data qubit on which a Z error has occurred. The second energy term is used to identify the second data qubit on which an X error has occurred. The third energy term reduces the energy as the number of data qubits each being a third data qubit on which both a Z error and an X error have simultaneously occurred increases. The information processing apparatus determines that a Y error has occurred on the third data qubit.Type: ApplicationFiled: July 27, 2023Publication date: March 14, 2024Applicants: Fujitsu Limited, OSAKA UNIVERSITYInventors: Jun FUJISAKI, Hirotaka OSHIMA, Keisuke FUJII
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Patent number: 11555866Abstract: A measurement apparatus includes: a memory; and a processor coupled to the memory and configured to: acquire, for each of two samples which are objects made of a same material, have different sizes, and have similar shapes, magnetization curve data measured for the sample and a shape parameter including a dimension of the sample; calculate magnetization of an inner part of each of the samples based on the acquired magnetization curve data and shape parameter of the sample by using a model representing magnetization of the object by separating the magnetization of the object into a magnetization component of a surface part and a magnetization component of an inner part of the object in accordance with a volume ratio between the surface part and the inner part of the object; and output the calculated result.Type: GrantFiled: August 30, 2021Date of Patent: January 17, 2023Assignee: FUJITSU LIMITEDInventors: Minoru Hoshina, Jun Fujisaki
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Patent number: 11531074Abstract: A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the dType: GrantFiled: September 16, 2021Date of Patent: December 20, 2022Assignee: Fujitsu LimitedInventors: Minoru Hoshina, Jun Fujisaki
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Publication number: 20220236343Abstract: A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the dType: ApplicationFiled: September 16, 2021Publication date: July 28, 2022Applicant: FUJITSU LIMITEDInventors: Minoru Hoshina, Jun FUJISAKI
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Publication number: 20220179014Abstract: A measurement apparatus includes: a memory; and a processor coupled to the memory and configured to: acquire, for each of two samples which are objects made of a same material, have different sizes, and have similar shapes, magnetization curve data measured for the sample and a shape parameter including a dimension of the sample; calculate magnetization of an inner part of each of the samples based on the acquired magnetization curve data and shape parameter of the sample by using a model representing magnetization of the object by separating the magnetization of the object into a magnetization component of a surface part and a magnetization component of an inner part of the object in accordance with a volume ratio between the surface part and the inner part of the object; and output the calculated result.Type: ApplicationFiled: August 30, 2021Publication date: June 9, 2022Applicant: FUJITSU LIMITEDInventors: Minoru Hoshina, Jun FUJISAKI
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Patent number: 10794966Abstract: A device includes a memory that stores a measurement-result of a first magnetization of a permanent-magnet corresponding to an external-magnetic field in an open-magnetic circuit; and a processor to divide the permanent-magnet into meshes, generate a function based on the measurement-result, the function indicating a second magnetization corresponding to the external-magnetic field in a closed-magnetic circuit, the function including a parameter having a value, calculate a diamagnetic-field corresponding to the external-magnetic field based on the second magnetization for each of the meshes, calculate a third magnetization of the permanent-magnet, calculate an average of the third magnetizations, calculate an error between the first magnetization and the calculated average, correct the value of the parameter, and repeat the calculation of the second magnetization, the diamagnetic-field, the third magnetizations, the average, and the error, and the correction of the value of the parameter until the error fallsType: GrantFiled: April 25, 2019Date of Patent: October 6, 2020Assignee: FUJITSU LIMITEDInventors: Jun Fujisaki, Atsushi Furuya, Hideyuki Shitara
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Publication number: 20190377033Abstract: A device includes: a memory that stores a measurement-result of a first magnetization of a permanent-magnet corresponding to an external-magnetic field in an open-magnetic circuit; and a processor to divide the permanent-magnet into meshes, generate a function based on the measurement-result, the function indicating a second magnetization corresponding to the external-magnetic field in a closed-magnetic circuit, the function including a parameter having a value, calculate a diamagnetic-field corresponding to the external-magnetic field based on the second magnetization for each of the meshes, calculate a third magnetization of the permanent-magnet, calculate an average of the third magnetizations, calculate an error between the first magnetization and the calculated average, correct the value of the parameter, and repeat the calculation of the second magnetization, the diamagnetic-field, the third magnetizations, the average, and the error, and the correction of the value of the parameter until the error fallType: ApplicationFiled: April 25, 2019Publication date: December 12, 2019Applicant: FUJITSU LIMITEDInventors: Jun FUJISAKI, Atsushi Furuya, Hideyuki Shitara
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Patent number: 10467184Abstract: A parallel processing apparatus includes: processors; and a network switch, wherein a first processor: generates divided matrix data by dividing the matrix data in such a manner that an overlapping portion is present with each other; transmits the divided matrix data to a second processor; generates first evaluation-value matrix data from the divided matrix data; transmits, to the second processor, first elements in a first overlapping portion of the first evaluation-value matrix data; receives, from the second processor, second elements of a second overlapping portion of second evaluation-value matrix data; calculates first added evaluation data by adding the second elements to the first elements; transmits the first added evaluation data to the second processor; receives, from the second processor, second added evaluation data; and calculates a first C point or a first F point based on the first evaluation-value matrix data which is updated using the second added evaluation data.Type: GrantFiled: May 31, 2018Date of Patent: November 5, 2019Assignee: FUJITSU LIMITEDInventors: Jun Fujisaki, Ryoji Tandokoro, Akira Hosoi, Hideyuki Shitara
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Publication number: 20180349316Abstract: A parallel processing apparatus includes: processors; and a network switch, wherein a first processor: generates divided matrix data by dividing the matrix data in such a manner that an overlapping portion is present with each other; transmits the divided matrix data to a second processor; generates first evaluation-value matrix data from the divided matrix data; transmits, to the second processor, first elements in a first overlapping portion of the first evaluation-value matrix data; receives, from the second processor, second elements of a second overlapping portion of second evaluation-value matrix data; calculates first added evaluation data by adding the second elements to the first elements; transmits the first added evaluation data to the second processor; receives, from the second processor, second added evaluation data; and calculates a first C point or a first F point based on the first evaluation-value matrix data which is updated using the second added evaluation data.Type: ApplicationFiled: May 31, 2018Publication date: December 6, 2018Applicant: FUJITSU LIMITEDInventors: Jun FUJISAKI, Ryoji TANDOKORO, Akira HOSOI, Hideyuki Shitara
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Patent number: 10146894Abstract: A magnetization vector storing method includes: acquiring, by a computer, a saturation magnetization value of a material to be simulated from a database indicating the saturation magnetization value of each material; dividing each component of a magnetization vector indicating a magnetization state of the material to be simulated by the saturation magnetization value; and converting each component of the magnetization vector obtained after the dividing using the saturation magnetization into an integer value and storing the integer value in a storage unit.Type: GrantFiled: November 18, 2015Date of Patent: December 4, 2018Assignee: FUJITSU LIMITEDInventors: Jun Fujisaki, Koichi Shimizu
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Publication number: 20180107773Abstract: An information processing apparatus compares threshold values based on distance data indicating distances between a plurality of nodes in a first mesh model with coefficient values corresponding to a plurality of pairs of nodes in the first matrix data, and updates at least some of evaluation values corresponding to the nodes on the basis of a comparison result. The information processing apparatus generates second matrix data of a second mesh model created by excluding some of the nodes selected on the basis of the evaluation values from the first mesh model. Then, the information processing apparatus calculates a solution of a plurality of variables associated with the nodes, by using the first matrix data and the second matrix data.Type: ApplicationFiled: August 29, 2017Publication date: April 19, 2018Applicant: FUJITSU LIMITEDInventors: Jun FUJISAKI, Koichi Shimizu
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Publication number: 20160196372Abstract: A magnetization vector storing method includes: acquiring, by a computer, a saturation magnetization value of a material to be simulated from a database indicating the saturation magnetization value of each material; dividing each component of a magnetization vector indicating a magnetization state of the material to be simulated by the saturation magnetization value; and converting each component of the magnetization vector obtained after the dividing using the saturation magnetization into an integer value and storing the integer value in a storage unit.Type: ApplicationFiled: November 18, 2015Publication date: July 7, 2016Applicant: FUJITSU LIMITEDInventors: Jun FUJISAKI, Koichi SHIMIZU