Abstract: An embodiment of an LED lamp that generates light of a color temperature that decreases with decreasing power applied to the LED lamp may include at least one lighting arrangement that may include a first LED array of serially connected first LED chips, a second LED array of serially connected second LED chips; a first photoluminescence layer covering the first LED array for generating light of a first color temperature; a second photoluminescence layer covering the second LED array for generating light of a second different color temperature; and a linear resistor serially connected to the first LED array, wherein the first LED array and second LED array are connected in parallel.

Abstract: A variable spacing device includes a support member, a driving member, a number of movable graspers, a limiting block, and a pushing block. The movable graspers are slidably mounted in a line on the support member. Each movable grasper grasps a workpiece. The limiting block is mounted on the support member and arranged in parallel with the pushing member. The limiting block defines first sliding grooves having a length gradually decreasing along a same direction. The pushing block defines second sliding grooves having a length gradually increasing along a same direction. Each movable grasper moves within a corresponding one of the first sliding grooves and a corresponding one of the second sliding grooves. Two sidewalls of each first sliding groove and two sidewalls of each second sliding groove resist movement of the corresponding movable grasper.

Abstract: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails.

Abstract: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails.