Patents by Inventor Jun Gyo Bak

Jun Gyo Bak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Simultaneous measurement of the reflectivity of X-ray with different orders of reflections and apparatus for measurement thereof
    Patent number: 7209542
    Abstract: Disclosed are an apparatus and a method for simultaneously measuring integrated reflectivity of X-rays with different orders of reflections in crystal. Continuous X-rays are incident into the crystal and reflection intensities of the X-rays reflected from the crystal with different orders of reflections are measured based on Bragg's law, thereby measuring reflectivity of X-rays with different orders of reflections.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: April 24, 2007
    Assignee: Korea Basic Science Institute
    Inventors: Sang Gon Lee, Jun Gyo Bak, Manfred Bitter
  • X-ray tube
    Patent number: 6408053
    Abstract: Disclosed is an X-ray tube for generating X-rays linearly focused in a vertical or horizontal direction in accordance with the orientation of a filament used. The X-ray tube includes a linear filament arranged at a cathode included in the X-ray tube, the linear filament serving to allow an anode included in the X-ray tube to generate line-focused X-rays. The X-ray tube according to the present invention can be applied to a calibration for X-ray spectroscopes, or various applications requiring line-focused X-rays.
    Type: Grant
    Filed: October 26, 2000
    Date of Patent: June 18, 2002
    Assignee: Korea Basic Science Institute
    Inventors: Sang Gon Lee, Jun Gyo Bak, Manfred Bitter