Patents by Inventor Junhwan KWON

Junhwan KWON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical probe based on thin-film interference
    Patent number: 10598589
    Abstract: The present disclosure relates to a method of analysis by an optical marker, including: irradiating a broadband light source onto a spherical dielectric material; measuring an interference spectrum of reflected light from the spherical dielectric material; and analyzing the reflected light using thin-film interference theory.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: March 24, 2020
    Assignee: Research & Business Foundation Sungkyunkwan University
    Inventors: Myunghwan Choi, YongJae Jo, Junhwan Kwon
  • OPTICAL PROBE BASED ON THIN-FILM INTERFERENCE
    Publication number: 20190293549
    Abstract: The present disclosure relates to a method of analysis by an optical marker, including: irradiating a broadband light source onto a spherical dielectric material; measuring an interference spectrum of reflected light from the spherical dielectric material; and analyzing the reflected light using thin-film interference theory.
    Type: Application
    Filed: March 20, 2019
    Publication date: September 26, 2019
    Applicant: Research & Business Foundation Sungkyunkwan University
    Inventors: Myunghwan CHOI, YongJae JO, Junhwan KWON