Patents by Inventor Junhwan KWON

Junhwan KWON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240405393
    Abstract: A rechargeable battery includes: a spiral wound electrode assembly; a case accommodating the electrode assembly; a vent plate closing and sealing an opening at a side of the case; a current collecting plate electrically connecting a second electrode of the electrode assembly and a beading portion of the case; and a gasket between the second current collecting plate and the vent plate and between the second current collecting plate and the case. The second current collecting plate includes: a base portion on the second electrode; an elastic portion bent from the base portion at an inward angle toward a center of the base portion and at an outward angle toward an outer edge of the base portion; and a wing welding portion connected to an end of the elastic portion and welded to the beading portion.
    Type: Application
    Filed: March 15, 2024
    Publication date: December 5, 2024
    Inventors: Junho YANG, Joungku KIM, Woohyuk CHOI, Bonggeun KANG, Hyunsuk PARK, Junhwan KWON, Taeyoon LEE, Hyunki JUNG, Myungseob KIM, Gwan-hyeon YU, Sunggwi KO, Wootae JUN
  • Patent number: 10598589
    Abstract: The present disclosure relates to a method of analysis by an optical marker, including: irradiating a broadband light source onto a spherical dielectric material; measuring an interference spectrum of reflected light from the spherical dielectric material; and analyzing the reflected light using thin-film interference theory.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: March 24, 2020
    Assignee: Research & Business Foundation Sungkyunkwan University
    Inventors: Myunghwan Choi, YongJae Jo, Junhwan Kwon
  • Publication number: 20190293549
    Abstract: The present disclosure relates to a method of analysis by an optical marker, including: irradiating a broadband light source onto a spherical dielectric material; measuring an interference spectrum of reflected light from the spherical dielectric material; and analyzing the reflected light using thin-film interference theory.
    Type: Application
    Filed: March 20, 2019
    Publication date: September 26, 2019
    Applicant: Research & Business Foundation Sungkyunkwan University
    Inventors: Myunghwan CHOI, YongJae JO, Junhwan KWON