Patents by Inventor Junichi Taguchi

Junichi Taguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240148895
    Abstract: An antibody-drug conjugate represented by formula (I): (where Ab is an antibody, X is a group represented by formula (X-1), formula (X-2) or formula (X-3): (where at the left represents the binding site with NH and at the right represents the binding side with D), D is a group represented by formula (D-1) or formula (D-2): (where represents the binding site with X), and n is in the range of about 1 to about 8).
    Type: Application
    Filed: August 24, 2023
    Publication date: May 9, 2024
    Inventors: Masayuki MIYANO, Yuya NAKAZAWA, Kentaro ISO, Yuki YABE, Hirotatsu UMIHARA, Junichi TAGUCHI, Satoshi INOUE, Shuntaro TSUKAMOTO, Hiroyuki KOGAI, Atsumi YAMAGUCHI, Tsuyoshi AKAGI, Yohei MUKAI, Toshifumi HIRAYAMA, Masaki KATO, Toshiki MOCHIZUKI, Akihiko YAMAMOTO, Yuji YAMAMOTO, Takato SAKURADA
  • Patent number: 10535129
    Abstract: It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.
    Type: Grant
    Filed: December 7, 2011
    Date of Patent: January 14, 2020
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masahiro Kitazawa, Mitsuji Ikeda, Yuichi Abe, Junichi Taguchi, Wataru Nagatomo
  • Patent number: 9514528
    Abstract: Image processing apparatus includes: interpolation process image acquisition means for acquiring an interpolation process image of prescribed size which includes an interpolation point of an inputted image; Fourier transform means for subjecting the interpolation process image which is acquired with the interpolation process image acquisition means to Fourier transform; phase change means for changing, a phase of each value of the transformed interpolation process image which has been subjected to Fourier transform by the Fourier transform means, such that the interpolation point migrates to a desired nearby integer coordinate position; inverse Fourier transform means for subjecting the interpolation process image whose phase has been changed by the phase change means, to inverse Fourier transform; interpolation value determination means for adopting an interpolation point, a value of a pixel at the integer coordinate position, from the transformed interpolation process image subjected to inverse Fourier tran
    Type: Grant
    Filed: October 3, 2012
    Date of Patent: December 6, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Junichi Taguchi, Mitsuji Ikeda, Yuichi Abe, Osamu Inoue, Takahiro Kawasaki
  • Publication number: 20140341461
    Abstract: Image processing apparatus includes: interpolation process image acquisition means for acquiring an interpolation process image of prescribed size which includes an interpolation point of an inputted image; Fourier transform means for subjecting the interpolation process image which is acquired with the interpolation process image acquisition means to Fourier transform; phase change means for changing, a phase of each value of the transformed interpolation process image which has been subjected to Fourier transform by the Fourier transform means, such that the interpolation point migrates to a desired nearby integer coordinate position; inverse Fourier transform means for subjecting the interpolation process image whose phase has been changed by the phase change means, to inverse Fourier transform; interpolation value determination means for adopting an interpolation point, a value of a pixel at the integer coordinate position, from the transformed interpolation process image subjected to inverse Fourier tran
    Type: Application
    Filed: October 3, 2012
    Publication date: November 20, 2014
    Applicant: Hitachi, High-Technologies Corporation
    Inventors: Junichi Taguchi, Mitsuji Ikeda, Yuichi Abe, Osamu Inoue, Takahiro Kawasaki
  • Publication number: 20140023265
    Abstract: It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.
    Type: Application
    Filed: December 7, 2011
    Publication date: January 23, 2014
    Inventors: Masahiro Kitazawa, Mitsuji Ikeda, Yuichi Abe, Junichi Taguchi, Wataru Nagatomo
  • Patent number: 8285056
    Abstract: A matching degree computing apparatus is provided for comparing an input image and an object template image and computing a matching degree between an input image and an object template image based on the compared result. The computing apparatus includes a transforming unit for transforming the input image so as to be matched to the template object region and a computing unit for computing a matching degree between the transformed input image and the template image. The transforming unit provides a shaping unit for shaping a non-background region to the form of the template object region in the object corresponding region of the input image and a processing unit for arranging the non-background region contacting with the template object corresponding region so that the non-background region has no substantial impact on the matching degree in the object non-corresponding region of the input image.
    Type: Grant
    Filed: March 11, 2009
    Date of Patent: October 9, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Junichi Taguchi, Mitsuji Ikeda, Osamu Komuro, Akiyuki Sugiyama
  • Patent number: 8131059
    Abstract: In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value.
    Type: Grant
    Filed: January 31, 2008
    Date of Patent: March 6, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Junichi Taguchi, Takumichi Sutani
  • Patent number: 8019164
    Abstract: A similar image having a high correlation is selected through autocorrelation performs a template original image selected from an image photographed for a template, and a difference image between the similar image and template original image is formed. An image extracting a real difference is formed by removing noises and edges in unstable areas from the difference image. This image is added to the template original image to form a modified template. Template matching is performed by using the modified template as a template. The image extracting the real reference and added to the modified template functions to add an evaluation penalty to the similar image during matching evaluation to lower an evaluation value of the similar image so that a probability of erroneously recognizing the similar image as the image to be detected.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: September 13, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Junichi Taguchi, Mitsuji Ikeda
  • Publication number: 20090232405
    Abstract: A matching degree computing apparatus is provided for comparing an input image and an object template image and computing a matching degree between an input image and an object template image based on the compared result. The computing apparatus includes a transforming unit for transforming the input image so as to be matched to the template object region and a computing unit for computing a matching degree between the transformed input image and the template image. The transforming unit provides a shaping unit for shaping a non-background region to the form of the template object region in the object corresponding region of the input image and a processing unit for arranging the non-background region contacting with the template object corresponding region so that the non-background region has no substantial impact on the matching degree in the object non-corresponding region of the input image.
    Type: Application
    Filed: March 11, 2009
    Publication date: September 17, 2009
    Inventors: Junichi Taguchi, Mitsuji Ikeda, Osamu Komuro, Akiyuki Sugiyama
  • Publication number: 20080310702
    Abstract: In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value.
    Type: Application
    Filed: January 31, 2008
    Publication date: December 18, 2008
    Inventors: Junichi Taguchi, Takumichi Sutani
  • Publication number: 20080205769
    Abstract: A similar image having a high correlation is selected through autocorrelation performs a template original image selected from an image photographed for a template, and a difference image between the similar image and template original image is formed. An image extracting a real difference is formed by removing noises and edges in unstable areas from the difference image. This image is added to the template original image to form a modified template. Template matching is performed by using the modified template as a template. The image extracting the real reference and added to the modified template functions to add an evaluation penalty to the similar image during matching evaluation to lower an evaluation value of the similar image so that a probability of erroneously recognizing the similar image as the image to be detected.
    Type: Application
    Filed: January 29, 2008
    Publication date: August 28, 2008
    Inventors: Junichi Taguchi, Mitsuji Ikeda
  • Patent number: 6944325
    Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a second
    Type: Grant
    Filed: September 8, 2003
    Date of Patent: September 13, 2005
    Assignee: Hitachi High-Tech Electronics Engineering Co., Ltd.
    Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
  • Patent number: 6826291
    Abstract: A method of embedding information into contents includes a changeable range calculating step of obtaining a range where value change of the contents is imperceptible to the human being and a step of embedding information by changing the values of the contents within the changeable range.
    Type: Grant
    Filed: February 12, 2002
    Date of Patent: November 30, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Yoshiura, Isao Echizen, Junichi Taguchi, Akira Maeda, Takao Arai, Toshifumi Takeuchi
  • Publication number: 20040047500
    Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a second
    Type: Application
    Filed: September 8, 2003
    Publication date: March 11, 2004
    Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
  • Patent number: 6661912
    Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a second
    Type: Grant
    Filed: August 3, 1998
    Date of Patent: December 9, 2003
    Assignee: Hitachi Electronics Engineering Co., Ltd.
    Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikota, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
  • Publication number: 20020076086
    Abstract: A method of embedding information into contents includes a changeable range calculating step of obtaining a range where value change of the contents is imperceptible to the human being and a step of embedding information by changing the values of the contents within the changeable range.
    Type: Application
    Filed: February 12, 2002
    Publication date: June 20, 2002
    Inventors: Hiroshi Yoshiura, Isao Echizen, Junichi Taguchi, Akira Maeda, Takao Arai, Toshifumi Takeuchi
  • Patent number: 5929637
    Abstract: The present invention intends to easily perform arithmetic operations for determining flow velocities without making phase correction and to reduce the aliasing error. To this end, a plurality of data pieces having phase sensitivity are measured using phase contrast pulse sequences in a magnetic resonance diagnostic apparatus. When four data pieces having phase sensitivity of tetrahedral type are acquired, four measured images are obtained. Individual measured images have vector values at corresponding points. Predetermined pair images are subjected to an arithmetic operation for determining an angle between two vectors at individual points on the images, the thus obtained phase images are added and a sum image is multiplied by a suitable coefficient to produce an x-direction flow velocity image. Flow velocity images in y and z directions are similarly obtained and images determining the magnitudes of flow velocities can also be produced.
    Type: Grant
    Filed: February 10, 1997
    Date of Patent: July 27, 1999
    Assignee: Hitachi Medical Corporation
    Inventors: Junichi Taguchi, Shigeru Watanabe, Koichi Sano