Patents by Inventor Junichi Taguchi
Junichi Taguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240148895Abstract: An antibody-drug conjugate represented by formula (I): (where Ab is an antibody, X is a group represented by formula (X-1), formula (X-2) or formula (X-3): (where at the left represents the binding site with NH and at the right represents the binding side with D), D is a group represented by formula (D-1) or formula (D-2): (where represents the binding site with X), and n is in the range of about 1 to about 8).Type: ApplicationFiled: August 24, 2023Publication date: May 9, 2024Inventors: Masayuki MIYANO, Yuya NAKAZAWA, Kentaro ISO, Yuki YABE, Hirotatsu UMIHARA, Junichi TAGUCHI, Satoshi INOUE, Shuntaro TSUKAMOTO, Hiroyuki KOGAI, Atsumi YAMAGUCHI, Tsuyoshi AKAGI, Yohei MUKAI, Toshifumi HIRAYAMA, Masaki KATO, Toshiki MOCHIZUKI, Akihiko YAMAMOTO, Yuji YAMAMOTO, Takato SAKURADA
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Patent number: 10535129Abstract: It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.Type: GrantFiled: December 7, 2011Date of Patent: January 14, 2020Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Masahiro Kitazawa, Mitsuji Ikeda, Yuichi Abe, Junichi Taguchi, Wataru Nagatomo
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Patent number: 9514528Abstract: Image processing apparatus includes: interpolation process image acquisition means for acquiring an interpolation process image of prescribed size which includes an interpolation point of an inputted image; Fourier transform means for subjecting the interpolation process image which is acquired with the interpolation process image acquisition means to Fourier transform; phase change means for changing, a phase of each value of the transformed interpolation process image which has been subjected to Fourier transform by the Fourier transform means, such that the interpolation point migrates to a desired nearby integer coordinate position; inverse Fourier transform means for subjecting the interpolation process image whose phase has been changed by the phase change means, to inverse Fourier transform; interpolation value determination means for adopting an interpolation point, a value of a pixel at the integer coordinate position, from the transformed interpolation process image subjected to inverse Fourier tranType: GrantFiled: October 3, 2012Date of Patent: December 6, 2016Assignee: Hitachi High-Technologies CorporationInventors: Junichi Taguchi, Mitsuji Ikeda, Yuichi Abe, Osamu Inoue, Takahiro Kawasaki
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Publication number: 20140341461Abstract: Image processing apparatus includes: interpolation process image acquisition means for acquiring an interpolation process image of prescribed size which includes an interpolation point of an inputted image; Fourier transform means for subjecting the interpolation process image which is acquired with the interpolation process image acquisition means to Fourier transform; phase change means for changing, a phase of each value of the transformed interpolation process image which has been subjected to Fourier transform by the Fourier transform means, such that the interpolation point migrates to a desired nearby integer coordinate position; inverse Fourier transform means for subjecting the interpolation process image whose phase has been changed by the phase change means, to inverse Fourier transform; interpolation value determination means for adopting an interpolation point, a value of a pixel at the integer coordinate position, from the transformed interpolation process image subjected to inverse Fourier tranType: ApplicationFiled: October 3, 2012Publication date: November 20, 2014Applicant: Hitachi, High-Technologies CorporationInventors: Junichi Taguchi, Mitsuji Ikeda, Yuichi Abe, Osamu Inoue, Takahiro Kawasaki
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Publication number: 20140023265Abstract: It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.Type: ApplicationFiled: December 7, 2011Publication date: January 23, 2014Inventors: Masahiro Kitazawa, Mitsuji Ikeda, Yuichi Abe, Junichi Taguchi, Wataru Nagatomo
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Patent number: 8285056Abstract: A matching degree computing apparatus is provided for comparing an input image and an object template image and computing a matching degree between an input image and an object template image based on the compared result. The computing apparatus includes a transforming unit for transforming the input image so as to be matched to the template object region and a computing unit for computing a matching degree between the transformed input image and the template image. The transforming unit provides a shaping unit for shaping a non-background region to the form of the template object region in the object corresponding region of the input image and a processing unit for arranging the non-background region contacting with the template object corresponding region so that the non-background region has no substantial impact on the matching degree in the object non-corresponding region of the input image.Type: GrantFiled: March 11, 2009Date of Patent: October 9, 2012Assignee: Hitachi High-Technologies CorporationInventors: Junichi Taguchi, Mitsuji Ikeda, Osamu Komuro, Akiyuki Sugiyama
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Patent number: 8131059Abstract: In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value.Type: GrantFiled: January 31, 2008Date of Patent: March 6, 2012Assignee: Hitachi High-Technologies CorporationInventors: Junichi Taguchi, Takumichi Sutani
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Patent number: 8019164Abstract: A similar image having a high correlation is selected through autocorrelation performs a template original image selected from an image photographed for a template, and a difference image between the similar image and template original image is formed. An image extracting a real difference is formed by removing noises and edges in unstable areas from the difference image. This image is added to the template original image to form a modified template. Template matching is performed by using the modified template as a template. The image extracting the real reference and added to the modified template functions to add an evaluation penalty to the similar image during matching evaluation to lower an evaluation value of the similar image so that a probability of erroneously recognizing the similar image as the image to be detected.Type: GrantFiled: January 29, 2008Date of Patent: September 13, 2011Assignee: Hitachi High-Technologies CorporationInventors: Junichi Taguchi, Mitsuji Ikeda
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Publication number: 20090232405Abstract: A matching degree computing apparatus is provided for comparing an input image and an object template image and computing a matching degree between an input image and an object template image based on the compared result. The computing apparatus includes a transforming unit for transforming the input image so as to be matched to the template object region and a computing unit for computing a matching degree between the transformed input image and the template image. The transforming unit provides a shaping unit for shaping a non-background region to the form of the template object region in the object corresponding region of the input image and a processing unit for arranging the non-background region contacting with the template object corresponding region so that the non-background region has no substantial impact on the matching degree in the object non-corresponding region of the input image.Type: ApplicationFiled: March 11, 2009Publication date: September 17, 2009Inventors: Junichi Taguchi, Mitsuji Ikeda, Osamu Komuro, Akiyuki Sugiyama
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Publication number: 20080310702Abstract: In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value.Type: ApplicationFiled: January 31, 2008Publication date: December 18, 2008Inventors: Junichi Taguchi, Takumichi Sutani
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Publication number: 20080205769Abstract: A similar image having a high correlation is selected through autocorrelation performs a template original image selected from an image photographed for a template, and a difference image between the similar image and template original image is formed. An image extracting a real difference is formed by removing noises and edges in unstable areas from the difference image. This image is added to the template original image to form a modified template. Template matching is performed by using the modified template as a template. The image extracting the real reference and added to the modified template functions to add an evaluation penalty to the similar image during matching evaluation to lower an evaluation value of the similar image so that a probability of erroneously recognizing the similar image as the image to be detected.Type: ApplicationFiled: January 29, 2008Publication date: August 28, 2008Inventors: Junichi Taguchi, Mitsuji Ikeda
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Patent number: 6944325Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a secondType: GrantFiled: September 8, 2003Date of Patent: September 13, 2005Assignee: Hitachi High-Tech Electronics Engineering Co., Ltd.Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
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Patent number: 6826291Abstract: A method of embedding information into contents includes a changeable range calculating step of obtaining a range where value change of the contents is imperceptible to the human being and a step of embedding information by changing the values of the contents within the changeable range.Type: GrantFiled: February 12, 2002Date of Patent: November 30, 2004Assignee: Hitachi, Ltd.Inventors: Hiroshi Yoshiura, Isao Echizen, Junichi Taguchi, Akira Maeda, Takao Arai, Toshifumi Takeuchi
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Publication number: 20040047500Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a secondType: ApplicationFiled: September 8, 2003Publication date: March 11, 2004Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
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Patent number: 6661912Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a secondType: GrantFiled: August 3, 1998Date of Patent: December 9, 2003Assignee: Hitachi Electronics Engineering Co., Ltd.Inventors: Junichi Taguchi, Aritoshi Sugimoto, Masami Ikota, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke
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Publication number: 20020076086Abstract: A method of embedding information into contents includes a changeable range calculating step of obtaining a range where value change of the contents is imperceptible to the human being and a step of embedding information by changing the values of the contents within the changeable range.Type: ApplicationFiled: February 12, 2002Publication date: June 20, 2002Inventors: Hiroshi Yoshiura, Isao Echizen, Junichi Taguchi, Akira Maeda, Takao Arai, Toshifumi Takeuchi
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Patent number: 5929637Abstract: The present invention intends to easily perform arithmetic operations for determining flow velocities without making phase correction and to reduce the aliasing error. To this end, a plurality of data pieces having phase sensitivity are measured using phase contrast pulse sequences in a magnetic resonance diagnostic apparatus. When four data pieces having phase sensitivity of tetrahedral type are acquired, four measured images are obtained. Individual measured images have vector values at corresponding points. Predetermined pair images are subjected to an arithmetic operation for determining an angle between two vectors at individual points on the images, the thus obtained phase images are added and a sum image is multiplied by a suitable coefficient to produce an x-direction flow velocity image. Flow velocity images in y and z directions are similarly obtained and images determining the magnitudes of flow velocities can also be produced.Type: GrantFiled: February 10, 1997Date of Patent: July 27, 1999Assignee: Hitachi Medical CorporationInventors: Junichi Taguchi, Shigeru Watanabe, Koichi Sano