Patents by Inventor Jun Kawakami

Jun Kawakami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120053374
    Abstract: A process of making a chlorinated hydrocarbon through a thermal dehydrochlorination step in which an unsaturated compound represented by the following general formula (2) is obtained by thermally decomposing a saturated compound represented by the following general formula (1). CCl3—CCl2-mHm—CCl3-nHn??(1) CCl2?CCl2-mHm-1—CCl3-nHn??(2) (in the above formulas, m is 1 or 2, and n is an integer of 0 to 3.
    Type: Application
    Filed: June 17, 2010
    Publication date: March 1, 2012
    Inventors: Tadahiro Fukuju, Kikuo Yamamoto, Masayuki Moriwaki, Yasutaka Komatsu, Akihiro Saito, Shunsuke Hosaka, Dai Tsunoda, Jun Kawakami
  • Publication number: 20110075898
    Abstract: In the medical image interpreting apparatus having a pointing device for moving a cursor, medical image, interpretation report, and cursor are displayed on a display screen, and initial movement information and information on the destination of movement of the cursor are linked and stored, via the pointing device when the cursor begins to move, said initial movement information relevant to the initial movement is retrieved to obtain the linked information on the destination of movement and the cursor is moved to the destination of movement indicated in the obtained information on the destination of movement. Due to this, just by slightly moving the cursor, the cursor jumps to the desired destination of movement, therefore, it becomes possible to omit an operation of the pointing device in between.
    Type: Application
    Filed: September 23, 2010
    Publication date: March 31, 2011
    Applicants: Kabushiki Kaisha Toshiba, TOSHIBA MEDICAL SYSTEMS CORPORATION
    Inventors: Jun Kawakami, Kenichi Niwa, Maki Minakuchi, Takashi Kondo, Takashi Masuzawa
  • Publication number: 20080317309
    Abstract: Specific information for specifying a specific study or series for which an object, which is obtained by adding at least one information of a scan condition, a scan range, and a key image position as a basis of a diagnosis in an image, is to be generated is specified. It is determined whether or not an image for references is present in the specific study or series on the basis of additional information of at least one image related to the specific study or series. When it is determined that the image for references is present, an object about the specific study or series is generated afterwards, for example, in the unit of series by using the image for references and at least one information of a scan condition, a scan range, and a key image position of the additional information.
    Type: Application
    Filed: April 22, 2008
    Publication date: December 25, 2008
    Inventors: Muneyasu KAZUNO, Kenichi Niwa, Jun Kawakami, Koichi Terai
  • Publication number: 20070219651
    Abstract: In the medical image interpreting apparatus having a pointing device for moving a cursor, medical image, interpretation report, and cursor are displayed on a display screen, and initial movement information and information on the destination of movement of the cursor are linked and stored, via the pointing device when the cursor begins to move, said initial movement information relevant to the initial movement is retrieved to obtain the linked information on the destination of movement and the cursor is moved to the destination of movement indicated in the obtained information on the destination of movement. Due to this, just by slightly moving the cursor, the cursor jumps to the desired destination of movement, therefore, it becomes possible to omit an operation of the pointing device in between.
    Type: Application
    Filed: March 14, 2007
    Publication date: September 20, 2007
    Applicants: Kabushiki Kaisha Toshiba, TOSHIBA MEDICAL SYSTEMS CORPORATION
    Inventors: Jun Kawakami, Kenichi Niwa, Maki Minakuchi, Takashi Kondo, Takashi Masuzawa
  • Patent number: 6963408
    Abstract: A point diffraction interference measuring method comprises forming a substantially ideal spherical wave by using a point light source-generating unit 101, 102, allowing a light flux composed of the spherical wave to pass through a test sample 109, thereafter dividing the light flux into two light fluxes by using an optical path-dividing element 105, allowing one light flux of the divided light fluxes to pass through a pinhole 129 to covert the one light flux into a reference light beam which is a substantially ideal spherical wave, and detecting interference fringes generated by causing interference between the reference light beam and a measuring light beam which is the other light flux of the divided light fluxes. The wavefront aberration of the test sample can be measured by observing the interference fringes without being affected by the disturbance which would be otherwise caused by any system vibration or the like.
    Type: Grant
    Filed: March 18, 2004
    Date of Patent: November 8, 2005
    Assignee: Nikon Corporation
    Inventors: Mikihiko Ishii, Hisashi Shiozawa, Jun Kawakami, Yasushi Fukutomi, Yutaka Ichihara
  • Patent number: 6940605
    Abstract: Both the optical distance of the detected-light light path and the optical distance of the reference-light light path are simultaneously varied according to respective specified patterns, so that differences are created between the period of variation in the intensity of the required signal component (in the interference signals) and the periods of variation in the intensities of the coherent noise components. When the modulation scanning procedure is performed, the phase difference between the detected light and reference light in a specified state is determined as shape information for the above-mentioned detected surface on the basis of the interference signals output from the light-receiving element. As a result, it is possible to securely reduce the effects of coherent noise components generated as a result of the interference of specified noise light that has passed through at least portions of the detected-light light path and reference-light light path with the detected light or reference light.
    Type: Grant
    Filed: May 18, 2001
    Date of Patent: September 6, 2005
    Assignee: Nikon Corporation
    Inventors: Jun Kawakami, Hisashi Shiozawa
  • Publication number: 20040252311
    Abstract: A point diffraction interference measuring method comprises forming a substantially ideal spherical wave by using a point light source-generating unit 101, 102, allowing a light flux composed of the spherical wave to pass through a test sample 109, thereafter dividing the light flux into two light fluxes by using an optical path-dividing element 105, allowing one light flux of the divided light fluxes to pass through a pinhole 129 to covert the one light flux into a reference light beam which is a substantially ideal spherical wave, and detecting interference fringes generated by causing interference between the reference light beam and a measuring light beam which is the other light flux of the divided light fluxes. The wavefront aberration of the test sample can be measured by observing the interference fringes without being affected by the disturbance which would be otherwise caused by any system vibration or the like.
    Type: Application
    Filed: March 18, 2004
    Publication date: December 16, 2004
    Applicant: NIKON CORPORATION
    Inventors: Mikihiko Ishii, Hisashi Shiozawa, Jun Kawakami, Yasushi Fukutomi, Yutaka Ichihara
  • Publication number: 20030174342
    Abstract: Both the optical distance of the detected-light light path and the optical distance of the reference-light light path are simultaneously varied according to respective specified patterns, so that differences are created between the period of variation in the intensity of the required signal component (in the interference signals) and the periods of variation in the intensities of the coherent noise components. When the modulation scanning procedure is performed, the phase difference between the detected light and reference light in a specified state is determined as shape information for the above-mentioned detected surface on the basis of the interference signals output from the light-receiving element. As a result, it is possible to securely reduce the effects of coherent noise components generated as a result of the interference of specified noise light that has passed through at least portions of the detected-light light path and reference-light light path with the detected light or reference light.
    Type: Application
    Filed: November 18, 2002
    Publication date: September 18, 2003
    Inventors: Jun Kawakami, Hisashi Shiozawa
  • Patent number: 5767971
    Abstract: A second harmonic generation (SHG) device is used for conversion of wavelength. The direction of polarization of light beams is suitably rotated by a direction-of-polarization rotating unit, for example by 45.degree., and thereafter these light beams are guided into the SHG device. This can minimize attenuation of intensity of light beam due to conversion of wavelength. Hence, using this direction-of-polarization rotating unit in the apparatus for measuring the medium, the intensity of light being incident upon the photodetector can be increased, whereby the refractive index of the medium can be measured more accurately than by the conventional apparatus.
    Type: Grant
    Filed: December 19, 1995
    Date of Patent: June 16, 1998
    Assignee: Nikon Corporation
    Inventors: Hitoshi Kawai, Jun Kawakami, Akira Ishida, Kouichi Tsukihara
  • Patent number: 5757489
    Abstract: The displacement of the stage of an exposure apparatus can be measured by obtaining the phase difference between a light beam reflected by a stationary mirror and a light beam reflected by a movable mirror placed on the stage. This apparatus calculates the position data of the stage at second time by using the position data of the stage at first time which is measured by using first and second frequencies, the position data of the stage at the first time which is measured by using a third frequency, and the position data of the stage at the second time which is measured by using the third frequency.
    Type: Grant
    Filed: August 23, 1996
    Date of Patent: May 26, 1998
    Assignee: Nikon Corporation
    Inventor: Jun Kawakami
  • Patent number: 5748315
    Abstract: The present invention relates to an optical interference measuring apparatus and method for measuring displacement of an object. The apparatus and method reduces the displacement-measurement error caused by changes of the refractive index of the atmosphere or the like, in a measurement optical path and a reference optical path, by suppressing crosstalk caused by unfavorable mixing of reference light and measurement light with each other, thereby improving accuracy in the measurement. The apparatus produces interference between a measurement light beam and a reference light beam. The measurement light is propagated through a measurement optical path including a measurement reflector, which is at least movable along the measurement optical path. The reference light is propagated through a reference optical path including a reference reflector. The interference occurs in a predetermined interference system, whereby the displacement of the measurement reflector can be measured.
    Type: Grant
    Filed: March 25, 1996
    Date of Patent: May 5, 1998
    Assignee: Nikon Corporation
    Inventors: Hitohsi Kawai, Jun Kawakami, Kouichi Tsukihara