Abstract: A testing system for testing electronic parts allows coexistence of the complicated control of signal generation and measurement and the time management thereof, enables a testing of a DUT under an environment close to that of a real operating environment and improves reliability of the testing. Slave subsystems are operated under control and management of a master subsystem. Control signal synchronizing means synchronize control signals from the master subsystem with one of master clocks MCLK1 and MCLK2, and outputs the synchronized control signal to the slave subsystems through clock distribution means. The clock distribution means is controlled such that master clock whose timing is identical with the synchronized control signal is input to each slave subsystem.

Abstract: An apparatus 1 for testing mixed signal electronic devices (i.e., devices, such as LSI devices, whose input/output signals include direct current signals, digital signals and analog signals, where the time relationship between the various input and output signals may be either synchronous or asynchronous) includes a master clock subsystem (MCLK-SS) 11, a subsystem group comprised of a digital master subsystem (DM-SS) 12, a digital slave subsystem (DS-SS) 13, a waveform generator subsystem (WG-SS) 14, a waveform digitizer subsystem (WD-SS) 15, a time measuring module (TMM) 16, and a direct current subsystem (DC-SS) 17, and an interfacing test head 18. The MCLK-SS 11 receives a master clock from a timing generator 21 or DSP 23 of the device under test (DUT) 186 and generates a first master clock MCLK1 and a second master clock MCLK2, each of which is synchronized with the master clock from the DUT.

Abstract: Highly pure 3,3',4,4'-biphenyltetracarboxylic acid (BPTA) and dianhydride thereof (BPDA) are produced by heating crude BPTA to give BPDA, treating the BPDA with hot water to give highly pure BPTA, and in the case of highly pure BPDA, heat treating the pure BPTA to give highly pure BPDA.