Abstract: An object is to eliminate waste of resources and achieve cost reduction and improved productivity. A stitcher includes a stitcher head configured to perform a reciprocating movement and a wire feed unit configured to feed a wire to the stitcher head and performs wire stitching on a paper bundle arranged at a wire stitching position in each cycle of the reciprocating movement of the stitcher head. The stitcher control device includes: a determination unit that determines in each cycle of the stitcher head whether or not thickness information on a paper bundle to be subjected to wire stitching in a next cycle is acquired; and a wire feed control unit that, when it is determined that the thickness information on the paper bundle to be subjected to wire stitching in the next cycle is not acquired, controls the wire feed unit not to supply a wire in the current cycle.

Abstract: A pogo block includes: a conductor having a first terminal connected to a terminal of a board of an inspection part, a second terminal connected to a terminal of a probe card, and an elastically expandable and contractible connection portion connecting the first terminal and the second terminal, and configured to be expandable and contractible in a direction connecting the first terminal and the second terminal; and a housing having a first holder configured to hold the first terminal, a second holder configured to hold the second terminal, and a guider into which the elastically expandable and contractible connection portion is inserted and configured to guide movements of the first holder and the second holder in the direction connecting the first terminal and the second terminal.

Abstract: An intermediate connecting member according to one aspect of the present disclosure is provided between a first member including multiple first terminals and a second member including multiple second terminals. The intermediate connecting member includes multiple connection parts configured to electrically connect the first terminals to the second terminals, and a retainer holding the multiple connection parts. Each of the multiple connection parts is formed of an elastic member to which an electrically conductive property is given at least on a surface of the elastic member.

Abstract: An index tab forming system sequentially forms index tabs to a plurality of sheets without replacing a blade die. The index tab forming system includes a rotary die cutter 5 on which a long blade die that can form an index tab at any position of the sheet in the conveyance direction is mounted. Furthermore, the index tab forming system includes a rotational speed calculation unit configured to calculate the rotational speed of a conveyance roller pair 37 based on the rotational position of a die cut roller 50, a sheet position detection signal provided by a sheet detection sensor 40, the number of times of sheet conveyance, and a shift distance between respective index tabs and a conveyance roller control unit configured to control the rotational speed of the conveyance roller pair 37 based on the calculated rotational speed.

Abstract: There is provided a mounting table on which a substrate to be inspected is mounted. The mounting table comprises: a plurality of temperature sensors, each configured to measure a temperature of a corresponding one of a plurality of spots on the mounting table; and electrode pads, each connected to a corresponding one of the temperature sensors and installed on a mounting surface.

Abstract: An electrical connecting device having one or more contact members to be in contact with a contact target is provided. The electrical connecting device includes a main body having one or more recesses on a surface thereof opposed to the contact target, and a flexible portion that covers the recesses to form sealed spaces. The main body includes a gas exhaust passage and an air supply passage provided for each of the sealed spaces to adjust a pressure in each of the sealed spaces, and the contact members are respectively disposed to be opposed to the recesses with the flexible portion interposed therebetween.

Abstract: A conveyance control unit is provided with a conveyance request unit configured to transmit a conveyance request signal to a paper conveyance device at a conveyance request timing corresponding to a processing cycle of a downstream paper processing device, a passage information reception unit configured to receive a paper passage signal indicating that paper has been sent out from the paper conveyance device, and the determination unit configured to determine whether a conveyance delay has occurred based on timing when the paper passage signal was received. The conveyance request unit is configured to transmit the conveyance request signal at the conveyance request timing corresponding to the next processing cycle when it is determined that a conveyance delay has not occurred, and the conveyance request unit is configured not to transmit the conveyance request signal at the conveyance request timing corresponding to the next processing cycle when it is determined that a conveyance delay has occurred.

Abstract: An inspection system includes an inspection device that includes a stage on which a substrate is mounted and inspects the substrate on the stage, a temperature adjustment mechanism that adjusts the temperature of the stage, a substrate accommodating part, a temperature measurement substrate standby part that makes a temperature measurement substrate wait, a transfer unit that transfers the substrate and the temperature measurement substrate onto the stage, and a camera used for aligning the substrate on the stage. The temperature measurement substrate includes, on the surface thereof, a temperature measurement member whose state changes depending on the temperature. The transfer unit transfers the temperature measurement substrate onto the stage, the camera images the temperature measurement member, and the temperature of the temperature measurement substrate is measured from a change in the state of the temperature measurement member.

Abstract: In a method for contact accuracy assurance in an inspection apparatus, an alignment substrate having first marks is placed and aligned on a stage, and a position checking member, which is a transparent body simulating a probe card and has second marks at positions corresponding to the first marks, is coupled to a mounting part where the probe card is to be coupled. Further, the alignment substrate is placed in a contact area directly below the position checking member. Horizontal deviations between the first and the second marks are detected by capturing images of the first and the second marks with position checking cameras provided above the position checking member at positions respectively corresponding to the second marks to capture the images from a top down angle. The contact accuracy between the substrate and probes of the probe card is assured when the deviations are within an allowable range.

Abstract: An inspection device for inspecting an inspection target substrate includes a probe card, a tester, a plurality of conductive lines, and a resistor. The probe card has probes to be in contact with the inspection target substrate. The tester is configured to transmit and receive electric signals for an inspection to and from the inspection target substrate through the probes. The conductive lines electrically connect the probe card with the tester, and at least a part of the conductive lines is electrically connected to the probes. The resistor is formed at the probe card and serves as an electrical resistor. The tester is further configured to measure a resistance of the resistor based on the electric signals transmitted and received through the conductive lines.

Abstract: A temperature measurement member measures a temperature of an inspection object or a temperature of a mounting table on which the inspection object is placed inside an inspection apparatus that inspects the inspection object. The temperature measurement member is attached to an attachment position of a probe card used for electrical characteristic inspection in the inspection apparatus, and includes a main body having substantially a same shape as the probe card; a probe formed to extend from the main body toward the mounting table in a state in which the temperature measurement member is attached to the attachment position; and a temperature sensor configured to measure the temperature of the inspection object or the mounting table. The sensor transmits/receives a temperature measurement-related electrical signal to/from an inspection part via the probe card in the electrical characteristic inspection, and transmits a temperature measurement result to the inspection part.

Abstract: An intermediate connecting member according to one aspect of the present disclosure is provided between a first member including multiple first terminals and a second member including multiple second terminals. The intermediate connecting member includes multiple connection parts configured to electrically connect the first terminals to the second terminals, and a retainer holding the multiple connection parts. Each of the multiple connection parts is formed of an elastic member to which an electrically conductive property is given at least on a surface of the elastic member.

Abstract: A pogo block includes: a conductor having a first terminal connected to a terminal of a board of an inspection part, a second terminal connected to a terminal of a probe card, and an elastically expandable and contractible connection portion connecting the first terminal and the second terminal, and configured to be expandable and contractible in a direction connecting the first terminal and the second terminal; and a housing having a first holder configured to hold the first terminal, a second holder configured to hold the second terminal, and a guider into which the elastically expandable and contractible connection portion is inserted and configured to guide movements of the first holder and the second holder in the direction connecting the first terminal and the second terminal.

Abstract: There is provided an intermediate connection member provided between a first member having a plurality of first terminals and a second member having a plurality of second terminals to electrically connect the plurality of first terminals and the plurality of second terminals, respectively. The intermediate connection member includes: a block member including connection members configured to electrically connect the plurality of first terminals and the plurality of second terminals, respectively; a frame member having an insertion hole into which the block member is inserted; and an electronic component electrically connected to one of the connection members.

Abstract: A cleaning wafer is provided for cleaning a surface of a chuck top by being mounted on the chuck top, the chuck top having a gas supply port and a gas exhaust port on the surface thereof and being configured to mount a substrate thereon. The cleaning wafer has a plate-shaped main body and an inlet/outlet path which is provided in the main body, and to which gas is supplied from the gas supply port and from which the gas is exhausted to the exhaust port. Dust attached to the surface of the chuck top is removed by the gas being supplied to the inlet/output path and exhausted from the inlet/output path.

Abstract: An electrical connecting device having one or more contact members to be in contact with a contact target is provided. The electrical connecting device includes a main body having one or more recesses on a surface thereof opposed to the contact target, and a flexible portion that covers the recesses to form sealed spaces. The main body includes a gas exhaust passage and an air supply passage provided for each of the sealed spaces to adjust a pressure in each of the sealed spaces, and the contact members are respectively disposed to be opposed to the recesses with the flexible portion interposed therebetween.

Abstract: According to the present invention, in an inspection device which performs an inspection on a substrate with a tester by contacting the substrate with a plurality of probes of a probe card, this contact accuracy assurance method includes: placing, on a stage, an alignment substrate which has a plurality of marks; aligning the alignment substrate on the stage; mounting, at a prescribed position of a mounting part of the probe card, a position checking member which has a plurality of second marks at positions corresponding to the first marks of the alignment substrate, and which is composed of a transparent body simulating the probe card; placing the alignment substrate at a prescribed position in a contact region directly below the position checking member; capturing images of the first and second marks with positon checking cameras which have vertical image capturing directions and are provided at positions respectively corresponding to the second marks in an upper side of the position checking member, and de

Abstract: An intermediate connecting member according to one aspect of the present disclosure is provided between a first member including multiple first terminals and a second member including multiple second terminals. The intermediate connecting member includes multiple connection parts configured to electrically connect the first terminals to the second terminals, and a retainer holding the multiple connection parts. Each of the multiple connection parts is formed of an elastic member to which an electrically conductive property is given at least on a surface of the elastic member.

Abstract: An inspection device for inspecting an inspection target substrate includes a probe card, a tester, a plurality of conductive lines, and a resistor. The probe card has probes to be in contact with the inspection target substrate. The tester is configured to transmit and receive electric signals for an inspection to and from the inspection target substrate through the probes. The conductive lines electrically connect the probe card with the tester, and at least a part of the conductive lines is electrically connected to the probes. The resistor is formed at the probe card and serves as an electrical resistor. The tester is further configured to measure a resistance of the resistor based on the electric signals transmitted and received through the conductive lines.

Abstract: A temperature measurement member measures a temperature of an inspection object or a temperature of a mounting table on which the inspection object is placed inside an inspection apparatus that inspects the inspection object. The temperature measurement member is attached to an attachment position of a probe card used for electrical characteristic inspection in the inspection apparatus, and includes a main body having substantially a same shape as the probe card; a probe formed to extend from the main body toward the mounting table in a state in which the temperature measurement member is attached to the attachment position; and a temperature sensor configured to measure the temperature of the inspection object or the mounting table. The sensor transmits/receives a temperature measurement-related electrical signal to/from an inspection part via the probe card in the electrical characteristic inspection, and transmits a temperature measurement result to the inspection part.