Abstract: A battery test apparatus includes an enclosed battery holder which detachably holds a secondary battery, a thermostatic oven in which the battery holder is held, and a charge and discharge test device which charges and discharges the secondary battery held in the battery holder to test the secondary battery. The battery holder is constituted of a fireproof and pressure resistant container capable of withstanding ignition of the secondary battery. Since an exhaust port is connected to an exhaust pipe which discharges gas in the battery holder when the secondary battery ignites, the exhaust port discharges the gas to the outside of the thermostatic oven to release its pressure.

Abstract: An IC chip and overhang portions are stuck to tape by an adhesive agent layer having elasticity. A plurality of solder balls are attached to the tape. By soldering the solder balls to a printed board, a semiconductor device is mounted. In the case where a temperature cycle has been caused, thermal stress occurs between the IC chip and the printed board or between the hangover portion and the printed board because of a difference in coefficient of thermal expansion between the IC chip or the hangover portion and the printed board. However, this thermal stress is absorbed by the elasticity of the adhesive agent layer. As a result, little thermal stress is applied to solder balls. Even if the above described temperature cycle is repeated, therefore, the solder balls are electrically connected to the printed board stably over a long period of time. In addition, the area of the tape is widened by the area of the hangover portions.