Abstract: An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.

Abstract: An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.

Abstract: An exemplary contour measuring probe (10) includes a tube guide (12), a tip extension (20), a pair of hollow tubes (16), a plurality of pipes (104, 106), a linear measuring scale (18), and a displacement sensor (19). The tip extension (20) is configured to touch a surface of an object (50). The hollow tubes (16) are configured to be driven by a flux of air to push the tip extension (20) to move. The pipes (104, 106) are obliquely disposed in a tube guide (12) relative to the hollow tubes (16). The pipes (104, 106) allow the flux of air to be pumped on a sidewall of the hollow tubes (16). A part of the flux of air is ejected out of the tube guide (12). The linear measuring scale (18) and the displacement sensor (19) are respectively fixed relative to one of the tube guide (12) and the tip extension (20). The linear measuring scale (18) displays values of displacements of the tip extension (20). The displacement sensor (19) detects and reads the displacement values displayed by the linear measuring scale (18).

Abstract: An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).

Abstract: An exemplary machine tool includes a base and a drill for machining a specimen mounted on the base. The drill includes a main rotator and a bit holder mounted to the main rotator. The bit holder has a first rotator and a second rotator rotatably mounted to the bit holder. A rotate speed of the first rotator is different from that of the second rotator. The machine tool has high precision and efficiency.

Abstract: An exemplary machine tool includes a base and a drill for machining a specimen mounted on the base. The drill includes a main rotator and a bit holder mounted to the main rotator. The bit holder has a first rotator and a second rotator rotatably mounted to the bit holder. A first bit is mounted on the first rotator. A second bit is mounted on the second rotator. The machine tool has high precision and efficiency.

Abstract: An exemplary machine tool (20) includes a main equipment (30) and a plurality of peripheral equipments. The main equipment has a base (31) and a drill (34) disposed on the base. The peripheral equipments are separate from and connected to the main equipment. A precision of the machine tool does not worsened.

Abstract: An exemplary machine tool (20) includes a base (31) and a plurality of components (33, 34, 35). The movable components are made of metal or metallic alloy with density in a range from about 1.7×103 kg/m3 to about 3.3×103 kg/m3. The movable components have relatively small weight. Therefore, the machine tool can remain stable, when machining, although the base is small and light because of the light movable components. A precision of the machine tool is not decreased, and miniaturizing the machine tool is practicable.

Abstract: An exemplary distance measuring probe (100) includes a tube track (12), a tip extension (16), a pair of hollow tubes (14), a pair of air discharge systems (115), a linear measuring scale (18), and a displacement sensor (19). The tip extension is configured to touch a surface of an object (50). The linear measuring scale and the displacement sensor are respectively fixed relative to one of the tube track and the tip extension. The hollow tubes contain a flux of air, and are configured to cooperatively push the tip extension to move. Each air discharge system ejects part of air in the corresponding hollow tube out of the hollow tube. The linear measuring scale displays values of displacements of the tip extension. The displacement sensor detects and reads the displacement values displayed by the linear measuring scale.

Abstract: An exemplary contour measuring device (100) includes a pair of guide rails (13), a movable fixture (14), a first probe (15), a second probe (16), and an error correcting unit (17). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.

Abstract: An exemplary distance measuring probe (100) includes a tube track (12), a tip extension (16), a pair of hollow tubes (14), a pair of air discharge systems (115), a linear measuring scale (18), and a displacement sensor (19). The tip extension is configured to touch a surface of an object (50). The linear measuring scale and the displacement sensor are respectively fixed relative to one of the tube track and the tip extension. The hollow tubes contain a flux of air, and are configured to cooperatively push the tip extension to move. Each air discharge system ejects part of air in the corresponding hollow tube out of the hollow tube. The linear measuring scale displays values of displacements of the tip extension. The displacement sensor detects and reads the displacement values displayed by the linear measuring scale.

Abstract: A light guide plate mold (100) includes a surface (103) and a plurality of micro structures formed at the surface according to a predetermined pattern. Some micro structures have angular cross-sections and other micro structures have arcuate cross-sections. The light guide plate mold can manufacture light guide plates with simple structures, and the light guide plates can obtain emission light beams with good uniformity and brightness. Therefore, the manufactured light guide plates can be advantageously applied in back light systems of liquid crystal display devices. Furthermore, a method for manufacturing the light guide plate mold is also provided, the method has a relatively low cost, and can be executed with high speed and precision.

Abstract: A light guide plate (100) includes an incidence surface (101), an emission surface (102) and a reflection surface (103) opposite to the emission surface. Numerous recesses are formed on at least one of the three surfaces according to a predetermined pattern. Some recesses have angular cross-sections and can determine a direction of emission of light beams, and the other recesses have arcuate cross-sections and can determine the degree of uniformity of the emitted light beams. Therefore, the light beams can be emitted from a predetermined region of the light guide plate, and this ensures the emission light beams with improved uniformity and brightness. Thus the light guide plate can be advantageously applied in back light systems of liquid crystal display devices. A method for manufacturing the light guide plate is also provided.