Patents by Inventor Jun-Su Bae

Jun-Su Bae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Voltage monitoring apparatus in a semiconductor probe station
    Patent number: 7227372
    Abstract: An Electrical Die Sorting (EDS) process system for testing semiconductor chips comprises a probe station, a power supply unit configured in the probe station, and a voltage apparatus for measuring voltages of the power supply. The voltage apparatus comprises a measuring unit connected with voltage check terminals and a common ground terminal of the power supply unit, for measuring voltages between each of the voltage check terminals and the common ground terminal simultaneously; and a plurality of display units electrically connected with the measuring unit, for monitoring voltages of the respective voltage check terminals in real time.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: June 5, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Jun-Su Bae
  • Voltage apparatus in a semiconductor probe station
    Publication number: 20050099203
    Abstract: An Electrical Die Sorting (EDS) process system for testing semiconductor chips comprises a probe station, a power supply unit configured in the probe station, and a voltage apparatus for measuring voltages of the power supply. The voltage apparatus comprises a measuring unit connected with voltage check terminals and a common ground terminal of the power supply unit, for measuring voltages between each of the voltage check terminals and the common ground terminal simultaneously; and a plurality of display units electrically connected with the measuring unit, for monitoring voltages of the respective voltage check terminals in real time.
    Type: Application
    Filed: September 2, 2004
    Publication date: May 12, 2005
    Inventor: Jun-Su Bae