Abstract: A film thickness measuring apparatus includes a displacement sensor, and a film thickness calculator that includes a first processor, a second processor, and a third processor. The displacement sensor detects displacement of a sheet in its thickness direction at a location opposite to a portion of a terahertz scanner from which a terahertz wave is applied to a conveyance path. In accordance with a detection signal provided by the displacement sensor, the first processor determines the speed of displacement of the sheet in its thickness direction while the sheet is conveyed along the conveyance path. In accordance with the speed of displacement, the second processor corrects a scan waveform acquired by the terahertz scanner. In accordance with the peaks of the intensity of the terahertz wave that appear in the scan waveform corrected by the second processor, the third processor calculates the thickness of a film formed on the sheet.

Abstract: A catalytic converter includes: a tubular casing including at least a pair of holding tubular parts and a reduced diameter tubular part that integrally connects the holding tubular parts to each other; and a monolithic catalyst carrier accommodated in each of the holding tubular parts, the reduced diameter tubular part being obtained by press-forming a portion, between the holding tubular parts, of a casing material of a tubular shape that corresponds to that of the holding tubular parts. Flat parts are formed respectively in a plurality of places at intervals in a peripheral direction of the reduced diameter tubular part, a sensor being attached to at least one of the flat parts. Accordingly, a press load when press-forming the reduced diameter tubular part is suppressed from becoming large and unequal in the peripheral direction of the reduced diameter tubular part.

Abstract: A catalytic converter includes: a tubular casing including at least a pair of holding tubular parts and a reduced diameter tubular part that integrally connects the holding tubular parts to each other; and a monolithic catalyst carrier accommodated in each of the holding tubular parts, the reduced diameter tubular part being obtained by press-forming a portion, between the holding tubular parts, of a casing material of a tubular shape that corresponds to that of the holding tubular parts. Flat parts are formed respectively in a plurality of places at intervals in a peripheral direction of the reduced diameter tubular part, a sensor being attached to at least one of the flat parts. Accordingly, a press load when press-forming the reduced diameter tubular part is suppressed from becoming large and unequal in the peripheral direction of the reduced diameter tubular part.

Abstract: A film thickness measuring apparatus includes a displacement sensor, and a film thickness calculator that includes a first processor, a second processor, and a third processor. The displacement sensor detects displacement of a sheet in its thickness direction at a location opposite to a portion of a terahertz scanner from which a terahertz wave is applied to a conveyance path. In accordance with a detection signal provided by the displacement sensor, the first processor determines the speed of displacement of the sheet in its thickness direction while the sheet is conveyed along the conveyance path. In accordance with the speed of displacement, the second processor corrects a scan waveform acquired by the terahertz scanner. In accordance with the peaks of the intensity of the terahertz wave that appear in the scan waveform corrected by the second processor, the third processor calculates the thickness of a film formed on the sheet.

Abstract: A film thickness measuring device including: a terahertz wave generator; a prism that has an entrance surface, an abutment surface capable of abutting a surface of a sample including a first film on a side where the first film is formed, and an emission surface; a terahertz wave detector that detects an S-polarization component and a P-polarization component of a reflected wave from the sample, emitted from the emission surface of the prism; and a control section configured to determine a thickness of the first film formed in the sample, based on a difference between a time waveform of the S-polarization component of the reflected wave and a time waveform of the P-polarization component of the reflected wave.

Abstract: A film thickness measuring device including: a terahertz wave generator; a prism that has an entrance surface, an abutment surface capable of abutting a surface of a sample including a first film on a side where the first film is formed, and an emission surface; a terahertz wave detector that detects an S-polarization component and a P-polarization component of a reflected wave from the sample, emitted from the emission surface of the prism; and a control section configured to determine a thickness of the first film formed in the sample, based on a difference between a time waveform of the S-polarization component of the reflected wave and a time waveform of the P-polarization component of the reflected wave.

Abstract: A terahertz band wavelength plate includes: a first metallic plate; and a second metallic plate which is disposed opposite the first metallic plate, wherein at least one of the first and second metallic plates has a periodic dielectric constant distribution in which a plasmon is excited.

Abstract: The coating film inspection apparatus according to one embodiment of the present invention comprises a terahertz-wave generator that generates a terahertz-wave; an irradiation optical system that irradiates, with the terahertz-wave, a sample with a film formed thereon; a terahertz-wave detector that detects a terahertz-wave reflected at the sample; and a control unit that shows an electric field intensity of the detected terahertz-wave in wave form data on a time axis to detect a plurality of peaks from the wave form data, and also calculates film thickness on the basis of time difference between peaks.

Abstract: The coating film inspection apparatus according to one embodiment of the present invention comprises a terahertz-wave generator that generates a terahertz-wave; an irradiation optical system that irradiates, with the terahertz-wave, a sample with a film formed thereon; a terahertz-wave detector that detects a terahertz-wave reflected at the sample; and a control unit that shows an electric field intensity of the detected terahertz-wave in wave form data on a time axis to detect a plurality of peaks from the wave form data, and also calculates film thickness on the basis of time difference between peaks.