Abstract: Manufacturing a device may include inspecting a surface of an inspection target device. The inspecting may include forming a metal layer on a surface of the inspection target device on which a minute pattern is formed, directing a beam of light to be incident and normal to the surface of the inspection target device, determining a spectrum of light reflected from the surface of the inspection target device, and generating, via the spectrum, information associated with a structural characteristic of the minute pattern formed on the inspection target device. The inspection target device may be selectively incorporated into the manufactured device based on the generated information.

Abstract: A clock signal generator includes an optic mirror rotatable to scan an incident light beam in a first direction, a grid plate including a plurality of grid arrays arranged in a second direction different from the first direction, wherein light reflected from the optic mirror is selectively passed through when the light beam is scanned on the grid plate in the first direction, the grid array being offset in the first direction by a particular distance with respect to an adjacent grid array, a light detector configured to detect a light passing through the grid arrays, and a pixel clock generator configured to generate a clock signal based on detection signals received from the light detector.

Abstract: An optical inspection apparatus includes a broadband light source, a monochromator, an image obtaining apparatus, and an analysis device. The monochromator is configured to convert light from the broadband light source into a plurality of monochromatic beams of different wavelengths and sequentially output the monochromatic beams, where each beam has a preset wavelength width and corresponds to one of a plurality of different wavelength regions. The image obtaining apparatus is configured to allow each monochromatic beam output from the monochromator to be incident to a top surface of an inspection target without using a beam splitter, allow light reflected by the inspection target to travel in a form of light of an infinite light source, and generate 2D images of the inspection target. The analysis device is configured to analyze the 2D images of the inspection target in the plurality of wavelength regions.

Abstract: Manufacturing a device may include inspecting a surface of an inspection target device. The inspecting may include forming a metal layer on a surface of the inspection target device on which a minute pattern is formed, directing a beam of light to be incident and normal to the surface of the inspection target device, determining a spectrum of light reflected from the surface of the inspection target device, and generating, via the spectrum, information associated with a structural characteristic of the minute pattern formed on the inspection target device. The inspection target device may be selectively incorporated into the manufactured device based on the generated information.

Abstract: A clock signal generator includes an optic mirror rotatable to scan an incident light beam in a first direction, a grid plate including a plurality of grid arrays arranged in a second direction different from the first direction, wherein light reflected from the optic mirror is selectively passed through when the light beam is scanned on the grid plate in the first direction, the grid array being offset in the first direction by a particular distance with respect to an adjacent grid array, a light detector configured to detect a light passing through the grid arrays, and a pixel clock generator configured to generate a clock signal based on detection signals received from the light detector.

Abstract: Semiconductor storage devices and methods of operating the same are provided. The semiconductor storage device including a non-volatile memory device, and a memory controller configured to control the non-volatile memory device, the memory controller including a performance control module, the performance control module configured to control a performance level of the memory controller based on state information of the memory controller may be provided.

Abstract: Semiconductor storage devices and methods of operating the same are provided. The semiconductor storage device including a non-volatile memory device, and a memory controller configured to control the non-volatile memory device, the memory controller including a performance control module, the performance control module configured to control a performance level of the memory controller based on state information of the memory controller may be provided.

Abstract: A data storage device and a software method using same are described. The method dynamically relocates and includes; upon receiving a requirement to load a new code object to a first storage medium, allocating a dynamic relocation region of the first storage medium, writing information related a task to be performed in relation to the dynamic relocation region to a second storage medium, selecting the new code object from a plurality of code objects stored in the second storage medium, and loading the selected new code object to the allocated dynamic relocation region, and generating information for performing a task associated with the loaded new code object.

Abstract: A data storage device and a software method using same are described. The method dynamically relocates and includes; upon receiving a requirement to load a new code object to a first storage medium, allocating a dynamic relocation region of the first storage medium, writing information related a task to be performed in relation to the dynamic relocation region to a second storage medium, selecting the new code object from a plurality of code objects stored in the second storage medium, and loading the selected new code object to the allocated dynamic relocation region, and generating information for performing a task associated with the loaded new code object.