Abstract: A line structure of a line on glass method in a reflective or a transflective liquid crystal display device and a method for manufacturing the same is disclosed, which offers decreased resistance by connecting a plurality of input lines in parallel. The LCD device includes a first line layer formed on a substrate, a first insulating layer formed on the substrate, having a contact hole at the first line layer, a second line layer formed on the first insulating layer, a second insulating layer formed on the substrate, having respective contact holes at the first and second line layers, a third line layer formed on the second insulating layer, a passivation layer formed on the substrate, having respective contact holes at the first, second and third line layers, and a pixel electrode on the passivation layer to electrically connect the first, second and third line layers through each contact hole.

Abstract: An array substrate for a reflective liquid crystal display device, including a gate line and a data line defining a pixel region by crossing each other; a switching element at a crossing portion of the gate line and the data line; a first passivation layer covering the switching element and the data line; and formed of an inorganic insulating material; a reflective electrode on the first passivation layer, and connected to the switching element; and a second passivation layer on the reflective electrode. The second passivation layer being formed of an organic insulating material.

Abstract: An X-ray image sensor fabricated using eight-mask steps. A thin film transistor (TFT) having a gate electrode, a first insulation layer, pure and doped amorphous silicon layers, and source and drain electrodes is on a substrate. An island-shaped first insulation layer, semiconductor layer, and ground line are also formed. A second insulation layer having a first drain contact hole and a ground line contact hole covers the TFT, the substrate, and the ground line. An auxiliary drain electrode on the second insulation layer contacts the drain electrode through the first drain contact hole. A capacitor electrode on the second insulation layer contacts the ground line through the ground line contact hole. A third insulation layer having a second drain contact hole that exposes the auxiliary drain is on the second insulation layer, the auxiliary drain electrode, and the capacitor electrode. A pixel electrode on the third insulation layer contacts the auxiliary drain electrode through the second drain contact hole.

Abstract: The present invention relates to a titanium diboride sintered body and a method for manufacturing thereof wherein silicon nitride is added to a titanium diboride as a sintering aid. The sintered body according to the present invention has a fine structure and excellent physical characteristics such as a strength, hardness, etc. Therefore, the sintered body according to the present invention may be applicable to certain materials which requires high strength and hardness.

Abstract: A X-ray detecting device and a fabricating method thereof that is capable of preventing a contact badness among a drain electrode, a ground electrode and a transparent electrode. In the device, first and second auxiliary electrodes are formed from the same metal material as the gate electrode. Accordingly, the first and second auxiliary electrodes are provided such that the drain electrode and the ground electrode are electrically connected to the transparent electrode with the aid of the first and second auxiliary electrodes even though they are over-etched.

Abstract: A liquid crystal device (LCD) includes a first substrate; a second substrate coupled to the first substrate; a plurality of scan lines and a plurality of data lines arranged over the first substrate, the scan lines intersecting the data lines to define pixel areas; thin film transistors (TFTs) over the first substrate adjacent intersections of the scan lines and data lines; substantially bilaterally, symmetric pixel electrodes in the pixel areas; and a liquid crystal layer interposed between the first and second substrates.

Abstract: An array substrate for use in an X-ray sensing device is fabricated using an etching stopper that enables good control of the etching process, and an electrode that prevents damage caused by static electricity generated during a dry-etching step. During fabrication, the array substrate includes a plurality of gate lines that are all electrically connected to an electrode pattern via gate line extensions and gate line contact holes. The electrode pattern causes the gate lines to have equipotentials, which reduces static electricity induced defects.

Abstract: An X-ray image sensor fabricated using only eight-masks includes: a substrate; a thin film transistor (TFT) formed in the switching region of the substrate and having a gate electrode, a first insulation layer, a pure amorphous silicon layer, a doped amorphous silicon layer and source and drain electrodes; an island-shaped first insulation layer and a island-shaped semiconductor layer formed over the substrate in the pixel region; a ground line formed on the island-shaped semiconductor layer; a second insulation layer formed on the TFT, on the substrate and on the ground line, the second insulation layer having a first drain contact hole, which expose the portion of the drain electrode, and a ground line contact hole, which expose the portion of the ground line; a auxiliary drain electrode formed on the second insulation layer and contacting the drain electrode through the first drain contact hole; a capacitor electrode formed on the second insulation layer and contacting the ground line through the ground li

Abstract: An apparatus for measuring thickness and a method therefor are disclosed, in which the precision is improved, the measuring time is shortened, the reliability is upgraded, and the flatness of thickness also can be precisely measured. The apparatus for measuring thickness according to the present invention includes a test piece retaining part for retaining a test piece and for moving it along X, Y and Z axes. The apparatus further includes a sensing part having a sensor retaining part for retaining an upper sensor, and having a test piece retaining part supporting table for supporting the test piece retaining part and having a lower sensor fixed thereon. The test piece retaining part includes: an X axis carrying part capable of moving in the direction of X axis, a Y axis carrying part capable of moving in the direction of Y axis, and a Z axis carrying part capable of moving in the direction of Z axis.