Abstract: For analog to digital conversion with correlated double sampling in an image sensor, a pixel signal from a given pixel is sampled to generate a respective sampled signal N-times, with N>1 within a horizontal scan time period. A ramp signal is generated with a respective ramping portion for each respective sampled signal. Each respective sampled signal is compared with a respective ramping portion to generate a respective comparison signal that determines a respective digital code. The N respective digital codes are summed to generate a final digital code with reduced random noise.

Abstract: A CMOS image sensor may include an active pixel sensor array and a noise canceller array corresponding to the active pixel sensor array. A method of operating such an CMOS image sensor may involve generating a varying reference signal that mirrors noise external to the active pixel sensor array, outputting the varying reference signal to the noise canceller array, and using the varying reference signal in the noise canceller array to cancel noise both internal to and external to the active pixel sensor array.

Abstract: An image pick-up device includes a first correlated double sampling circuit configured to generate a first sampling signal by performing correlated double sampling on an active pixel signal output from an active pixel and generating a first comparison signal by comparing the first sampling signal with a reference signal, and a second correlated double sampling circuit to generate a second sampling signal by performing correlated double sampling on an OB pixel signal output from an optical black pixel and generating a second comparison signal by comparing the second sampling signal with the reference signal.

Abstract: A CMOS image sensor may include an active pixel sensor array and a noise canceller array corresponding to the active pixel sensor array. A method of operating such an CMOS image sensor may involve generating a varying reference signal that mirrors noise external to the active pixel sensor array, outputting the varying reference signal to the noise canceller array, and using the varying reference signal in the noise canceller array to cancel noise both internal to and external to the active pixel sensor array.

Abstract: An image pick-up device includes a first correlated double sampling circuit configured to generate a first sampling signal by performing correlated double sampling on an active pixel signal output from an active pixel and generating a first comparison signal by comparing the first sampling signal with a reference signal, and a second correlated double sampling circuit to generate a second sampling signal by performing correlated double sampling on an OB pixel signal output from an optical black pixel and generating a second comparison signal by comparing the second sampling signal with the reference signal.

Abstract: For signal processing such as in an image sensor, a CDS (correlated double sampling) unit generates a first CDS signal from a first set of input signals at a predetermined node. In addition, a conversion unit converts a second CDS signal into a respective converted signal concurrently as the CDS unit generates the fist CDS signal. The second CDS signal is determined from a second set of input signals previously generated at the predetermined node.

Abstract: For clamping a reset voltage within an image sensor, an active pixel generates a first reset voltage, and an optical black pixel generates a second reset voltage. In addition, a reset voltage selector selects one of the first and second reset voltages as a selected reset voltage. Such a selected reset voltage is generated separately for each column of the array of pixels in the image sensor for more accurately and flexibly accounting for fabrication variations.

Abstract: For analog to digital conversion with correlated double sampling in an image sensor, a pixel signal from a given pixel is sampled to generate a respective sampled signal N-times, with N>1 within a horizontal scan time period. A ramp signal is generated with a respective ramping portion for each respective sampled signal. Each respective sampled signal is compared with a respective ramping portion to generate a respective comparison signal that determines a respective digital code. The N respective digital codes are summed to generate a final digital code with reduced random noise.

Abstract: For signal processing such as in an image sensor, a CDS (correlated double sampling) unit generates a first CDS signal from a first set of input signals at a predetermined node. In addition, a conversion unit converts a second CDS signal into a respective converted signal concurrently as the CDS unit generates the fist CDS signal. The second CDS signal is determined from a second set of input signals previously generated at the predetermined node.

Abstract: A CMOS image sensor may include an active pixel sensor array and a noise canceller array corresponding to the active pixel sensor array. A method of operating such an CMOS image sensor may involve generating a varying reference signal that mirrors noise external to the active pixel sensor array, outputting the varying reference signal to the noise canceller array, and using the varying reference signal in the noise canceller array to cancel noise both internal to and external to the active pixel sensor array.

Abstract: For clamping a reset voltage within an image sensor, an active pixel generates a first reset voltage, and an optical black pixel generates a second reset voltage. In addition, a reset voltage selector selects one of the first and second reset voltages as a selected reset voltage. Such a selected reset voltage is generated separately for each column of the array of pixels in the image sensor for more accurately and flexibly accounting for fabrication variations.