Patents by Inventor Jung Eon Moon

Jung Eon Moon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200273856
    Abstract: A semiconductor integrated circuit may include a first power line, a second power line, a third power line and a protection circuit. The first power line may receive an external voltage. The second power line may receive a voltage greater than the external voltage. The third power line may receive a voltage less than the external voltage applied to the first power line and the voltage applied to the second power line. The protection circuit may from a current path between the first power line, the second power line and the third power line when a surge voltage may be applied to the first power line to discharge the surge voltage to the third power line.
    Type: Application
    Filed: November 5, 2019
    Publication date: August 27, 2020
    Applicant: SK hynix Inc.
    Inventors: Chang Hwi LEE, Jung Eon MOON, Hyeng Ouk LEE, Joung Cheul CHOI
  • Patent number: 8780511
    Abstract: An electrostatic discharge protection circuit includes a diode chain coupled between a power supply voltage end and a control node, a control voltage generator configured to generate a control voltage in response to a first current flowing through the diode chain, and a discharger configured to discharge a second current from the power supply voltage end to a ground voltage end in response to the control voltage, wherein the diode chain includes a plurality of P-well regions formed in an N-well region, diodes formed in the respective P-well regions, and a resistor coupled between the diodes.
    Type: Grant
    Filed: August 2, 2011
    Date of Patent: July 15, 2014
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jung-Eon Moon
  • Publication number: 20120099230
    Abstract: An electrostatic discharge protection circuit includes a diode chain coupled between a power supply voltage end and a control node, a control voltage generator configured to generate a control voltage in response to a first current flowing through the diode chain, and a discharger configured to discharge a second current from the power supply voltage end to a ground voltage end in response to the control voltage, wherein the diode chain includes a plurality of P-well regions formed in an N-well region, diodes formed in the respective P-well regions, and a resistor coupled between the diodes.
    Type: Application
    Filed: August 2, 2011
    Publication date: April 26, 2012
    Inventor: Jung-Eon MOON
  • Patent number: 7876541
    Abstract: An electrostatic discharge (ESD) protection circuit protects a gate oxide of elements in an internal circuit against ESD. During an ESD test, if the sum of driving voltages of ESD protectors connected between a power pad and a ground pad is higher than the gate oxide breakdown voltage of elements in the internal circuit, the structure of the ESD protector is changed or another ESD protector is additionally provided so as to protect the gate oxide of the elements in the internal circuit against ESD.
    Type: Grant
    Filed: November 3, 2009
    Date of Patent: January 25, 2011
    Assignee: Hynix Semiconductor Inc.
    Inventors: Jung Eon Moon, Dae Gwan Kang, Kook Whee Kwak, Nak Heon Choi, Si Woo Lee, Hee Jeong Son, Yun Suk, Seong Hoon Jeong, Joon Won Lee
  • Patent number: 7796367
    Abstract: An electrostatic discharge circuit includes a trigger section configured to detect voltage drops occurring by an electrostatic current transmitted to first and second voltage lines, and to provide pull-up and pull-down detection voltages, an auxiliary discharge section configured to operate by the pull-up and pull-down detection voltages, and to discharge the electrostatic current introduced through an input/output pad to the first and second voltage lines, a main discharge section configured to operate by the pull-down detection voltage, to electrically connecting the first and second voltage lines, and to discharge the electrostatic current, and a CDM discharge section configured to operate by the pull-down detection voltage, and to discharge the electrostatic current supplied from the input/output pad to an internal circuit.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: September 14, 2010
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jung Eon Moon
  • Patent number: 7782583
    Abstract: An electrostatic discharge protection device includes a power supply line and a ground line. A voltage detection unit detects first and second detection voltages by forming an electrical connection between the power supply line and the ground line in response to alternating current of electrostatic current. A first transfer unit transfers the electrostatic current into the power supply line by forming an electrical connection between the input/output pad and the power supply line in response to the first detection voltage. A second transfer unit transfers the electrostatic current into the ground line by forming an electrical connection between the input/output pad and the ground line in response to the second detection voltage. A discharge unit discharges the electrostatic current flowing into the power supply line or the ground line by forming an electrical connection between the power supply line and the ground line in response to the second detection voltage.
    Type: Grant
    Filed: April 7, 2008
    Date of Patent: August 24, 2010
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jung Eon Moon
  • Publication number: 20100149704
    Abstract: An ESD protection circuit includes a detector coupled between a data power source line and a data ground voltage line to detect static electricity and to output a detection voltage at a detection node, a pre-driver coupled between a power source voltage line and a ground voltage line to output a driving signal at a control node, a data output driver coupled between a data input/output pad and the data ground voltage line to output data in response to the driving signal, and a controller coupled between the control node and the data ground voltage line to couple a terminal of the data output driver with the data ground voltage line based on the detection voltage when the static electricity is input.
    Type: Application
    Filed: December 3, 2009
    Publication date: June 17, 2010
    Inventor: Jung-Eon Moon
  • Patent number: 7733618
    Abstract: An electrostatic discharge device includes a first protection element including a MOS transistor type first diode, which provides a first capacitor including a first insulation layer, and provides a first path between an input/output pad and a power supply voltage line using the first diode, for discharging static electricity, a second protection element providing a second path between the input/output pad and a ground voltage line for discharging the static electricity, a trigger circuit including a resistor that is connected in series to the first capacitor, and a power clamp element providing a third path for discharging the static electricity between the power supply voltage line and the ground voltage line by a voltage applied to the resistor.
    Type: Grant
    Filed: July 1, 2008
    Date of Patent: June 8, 2010
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jung Eon Moon
  • Patent number: 7672103
    Abstract: A circuit for protecting a semiconductor device from electrostatic discharge by protecting an internal circuit from electrostatic current flowing into an input/output pad includes a first discharge unit that discharges the electrostatic current to a first power supply line or a second power supply line. A second discharge unit protects the internal circuit from electrostaticity flowing from the input/output pad or the second power supply line. A power clamp unit discharges the electrostatic current, which is discharged to the first power supply line or the second power supply line by the first discharge unit, to the opposite power supply line. A trigger unit drives the first discharge unit and the power clamp unit with first and second detection voltages generated in response to a voltage drop of the discharged electrostatic current.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 2, 2010
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jung Eon Moon
  • Publication number: 20100046131
    Abstract: An electrostatic discharge (ESD) protection circuit protects a gate oxide of elements in an internal circuit against ESD. During an ESD test, if the sum of driving voltages of ESD protectors connected between a power pad and a ground pad is higher than the gate oxide breakdown voltage of elements in the internal circuit, the structure of the ESD protector is changed or another ESD protector is additionally provided so as to protect the gate oxide of the elements in the internal circuit against ESD.
    Type: Application
    Filed: November 3, 2009
    Publication date: February 25, 2010
    Applicant: HYNIX SEMICONDUCTOR INC.
    Inventors: Jung Eon Moon, Dae Gwan Kang, Kook Whee Kwak, Nak Heon Choi, Si Woo Lee, Hee Jeong Son, Yun Suk, Seong Hoon Jeong, Joon Won Lee
  • Patent number: 7616415
    Abstract: An electrostatic discharge (ESD) protection circuit protects a gate oxide of elements in an internal circuit against ESD. During an ESD test, if the sum of driving voltages of ESD protectors connected between a power pad and a ground pad is higher than the gate oxide breakdown voltage of elements in the internal circuit, the structure of the ESD protector is changed or another ESD protector is additionally provided so as to protect the gate oxide of the elements in the internal circuit against ESD.
    Type: Grant
    Filed: April 13, 2007
    Date of Patent: November 10, 2009
    Assignee: Hynix Semiconductor Inc.
    Inventors: Jung Eon Moon, Dae Gwan Kang, Kook Whee Kwak, Nak Heon Choi, Si Woo Lee, Hee Jeong Son, Suk Yun, Seong Hoon Jeong, Joon Won Lee
  • Publication number: 20090201616
    Abstract: A circuit for protecting a semiconductor device from electrostatic discharge by protecting an internal circuit from electrostatic current flowing into an input/output pad includes a first discharge unit that discharges the electrostatic current to a first power supply line or a second power supply line. A second discharge unit protects the internal circuit from electrostaticity flowing from the input/output pad or the second power supply line. A power clamp unit discharges the electrostatic current, which is discharged to the first power supply line or the second power supply line by the first discharge unit, to the opposite power supply line. A trigger unit drives the first discharge unit and the power clamp unit with first and second detection voltages generated in response to a voltage drop of the discharged electrostatic current.
    Type: Application
    Filed: March 14, 2008
    Publication date: August 13, 2009
    Inventor: Jung Eon MOON
  • Publication number: 20090141415
    Abstract: An electrostatic discharge circuit includes a trigger section configured to detect voltage drops occurring by an electrostatic current transmitted to first and second voltage lines, and to provide pull-up and pull-down detection voltages, an auxiliary discharge section configured to operate by the pull-up and pull-down detection voltages, and to discharge the electrostatic current introduced through an input/output pad to the first and second voltage lines, a main discharge section configured to operate by the pull-down detection voltage, to electrically connecting the first and second voltage lines, and to discharge the electrostatic current, and a CDM discharge section configured to operate by the pull-down detection voltage, and to discharge the electrostatic current supplied from the input/output pad to an internal circuit.
    Type: Application
    Filed: November 26, 2008
    Publication date: June 4, 2009
    Applicant: HYNIX SEMICONDUCTOR INC.
    Inventor: Jung Eon Moon
  • Publication number: 20090009917
    Abstract: An electrostatic discharge device includes a first protection element including a MOS transistor type first diode, which provides a first capacitor including a first insulation layer, and provides a first path between an input/output pad and a power supply voltage line using the first diode, for discharging static electricity, a second protection element providing a second path between the input/output pad and a ground voltage line for discharging the static electricity, a trigger circuit including a resistor that is connected in series to the first capacitor, and a power clamp element providing a third path for discharging the static electricity between the power supply voltage line and the ground voltage line by a voltage applied to the resistor.
    Type: Application
    Filed: July 1, 2008
    Publication date: January 8, 2009
    Applicant: HYNIX SEMICONDUCTOR, INC.
    Inventor: Jung Eon Moon
  • Publication number: 20080259512
    Abstract: An electrostatic discharge protection device includes a power supply line and a ground line. A voltage detection unit detects first and second detection voltages by forming an electrical connection between the power supply line and the ground line in response to alternating current of electrostatic current. A first transfer unit transfers the electrostatic current into the power supply line by forming an electrical connection between the input/output pad and the power supply line in response to the first detection voltage. A second transfer unit transfers the electrostatic current into the ground line by forming an electrical connection between the input/output pad and the ground line in response to the second detection voltage. A discharge unit discharges the electrostatic current flowing into the power supply line or the ground line by forming an electrical connection between the power supply line and the ground line in response to the second detection voltage.
    Type: Application
    Filed: April 7, 2008
    Publication date: October 23, 2008
    Inventor: Jung Eon Moon
  • Publication number: 20070242401
    Abstract: An electrostatic discharge (ESD) protection circuit protects a gate oxide of elements in an internal circuit against ESD. During an ESD test, if the sum of driving voltages of ESD protectors connected between a power pad and a ground pad is higher than the gate oxide breakdown voltage of elements in the internal circuit, the structure of the ESD protector is changed or another ESD protector is additionally provided so as to protect the gate oxide of the elements in the internal circuit against ESD.
    Type: Application
    Filed: April 13, 2007
    Publication date: October 18, 2007
    Inventors: Jung Eon MOON, Dae Gwan KANG, Kook Whee KWAK, Nak Heon CHOI, Si Woo LEE, Hee Jeong SON, Suk YUN, Seong Hoon JEONG, Joon Won LEE