Patents by Inventor JUNG-HSIN WANG

JUNG-HSIN WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10260988
    Abstract: The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: April 16, 2019
    Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
    Inventors: Wei-Yao Hsu, Wei-Jei Peng, Zong-Ru Yu, Jung-Hsin Wang, Po-Jui Chen, Cheng-Fang Ho, Chi-Hung Huang, Chun-Cheng Chen, Hua-Lin Chen, Yi-Hao Lin, Ming-Fu Chen
  • Publication number: 20180356311
    Abstract: The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.
    Type: Application
    Filed: June 13, 2018
    Publication date: December 13, 2018
    Inventors: WEI-YAO HSU, WEI-JEI PENG, ZONG-RU YU, JUNG-HSIN WANG, PO-JUI CHEN, CHENG-FANG HO, CHI-HUNG HUANG, CHUN-CHENG CHEN, HUA-LIN CHEN, YI-HAO LIN, MING-FU CHEN