Patents by Inventor Jung-Ju Tsai

Jung-Ju Tsai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TESTING PROBE AND ELECTRICAL CONNECTION METHOD USING THE SAME
    Publication number: 20090096473
    Abstract: A testing probe including a shaft body and a plurality of claws is provided. Each cross section of the shaft body has a substantially identical shape and a substantially identical outer diameter. The claws are formed integrally with the shaft body at an end thereof. An orthogonal projection of the claws on any one of the cross sections of the shaft body is within the contour of the cross section. Contacting a solder bump on a test pad of a circuit board with the claws of the testing probe increases the test yield of the circuit board.
    Type: Application
    Filed: February 18, 2008
    Publication date: April 16, 2009
    Applicant: COMPAL ELECTRONICS, INC.
    Inventors: Jung-Ju Tsai, Chia-Lung Wu, Ching-Chien Yen, Hsiu-Feng Lee