Patents by Inventor Jung-Lan Lee

Jung-Lan Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for classifying repetitive defects on a substrate
    Patent number: 7339663
    Abstract: A method and apparatus of classifying repetitive defects on a substrate is provided. Defects of dies on the substrate are sequentially compared with a predetermined reference die. Sets of coordinates are marked on the reference die which are corresponding to the position of the defects on the dies on the substrate. Then, repetitive defects are classified which are repeatedly marked in a specified region on the reference die.
    Type: Grant
    Filed: July 13, 2005
    Date of Patent: March 4, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Young-Kyu Lim, Byung-Am Lee, Byung-Seol Ahn, Jae-Sun Cho, Chang-Hoon Lee, Jung-Lan Lee, Sung-Man Lee
  • Method and apparatus for classifying repetitive defects on a substrate
    Publication number: 20060012782
    Abstract: A method and apparatus of classifying repetitive defects on a substrate is provided. Defects of dies on the substrate are sequentially compared with a predetermined reference die. Sets of coordinates are marked on the reference die which are corresponding to the position of the defects on the dies on the substrate. Then, repetitive defects are classified which are repeatedly marked in a specified region on the reference die.
    Type: Application
    Filed: July 13, 2005
    Publication date: January 19, 2006
    Inventors: Young-Kyu Lim, Byung-Am Lee, Byung-Seol Ahn, Jae-Sun Cho, Chang-Hoon Lee, Jung-Lan Lee, Sung-Man Lee