Abstract: A method for fabricating a semiconductor device includes: forming a first oxide layer containing a first element over a first electrode layer; forming a second oxide layer containing a second element over the first oxide layer; forming a stacked structure in which a plurality of first oxide layers and a plurality of second oxide layers are alternately stacked by repeating the forming of the first oxide layer and the forming of the second oxide layer a plurality of times; and forming a second electrode layer over the stacked structure, wherein a thickness of a lowermost first oxide layer among the plurality of first oxide layers is greater than a thickness of each of other first oxide layers.

Abstract: A distance relay apparatus, a distance relay processing system and a method for processing a distance relay are disclosed. In accordance with an embodiment of the present invention, the distance relay processing system, which controls a distance relay, includes a lightning managing apparatus, which generates comprehensive lightning information by using lightning detection information and in which the lightning detection information is provided by a lightning detector, and a distance relay apparatus, which generates fault occurrence information by determining a fault location of a power transmission line and generates fault analysis information by using the fault occurrence information and the comprehensive lightning information.

Abstract: A distance relay apparatus, a distance relay processing system and a method for processing a distance relay are disclosed. In accordance with an embodiment of the present invention, the distance relay processing system, which controls a distance relay, includes a lightning managing apparatus, which generates comprehensive lightning information by using lightning detection information and in which the lightning detection information is provided by a lightning detector, and a distance relay apparatus, which generates fault occurrence information by determining a fault location of a power transmission line and generates fault analysis information by using the fault occurrence information and the comprehensive lightning information.