Patents by Inventor Jungho Mun

Jungho Mun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11921252
    Abstract: The present invention relates a security screening device, comprising: a radiation generator for respectively generating X-rays and neutron beams and irradiating same toward an inspection object; an inspection object transfer unit for changing the position of the inspection object; a radiation detector configured to respectively detect X-rays and neutron beams transmitted through the inspection object; and a gamma ray detector installed adjacent to the inspection object and configured to detect a gamma signal generated from the inspection object, wherein the radiation detector acquires image information of the inspection object by using radiation information detected from the X-rays and neutron beams that have passed through the inspection object, and the gamma ray detector analyzes the detected gamma ray to detect the location of the inspection object from the analysis of the inspection object and the image information.
    Type: Grant
    Filed: January 28, 2020
    Date of Patent: March 5, 2024
    Assignee: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
    Inventors: Byeongno Lee, Kyungmin Oh, Namho Lee, Moonsik Chae, Jungho Mun, Yeongheum Yeon, Jinsik Ju
  • Publication number: 20220187222
    Abstract: The present invention relates a security screening device, comprising: a radiation generator for respectively generating X-rays and neutron beams and irradiating same toward an inspection object; an inspection object transfer unit for changing the position of the inspection object; a radiation detector configured to respectively detect X-rays and neutron beams transmitted through the inspection object; and a gamma ray detector installed adjacent to the inspection object and configured to detect a gamma signal generated from the inspection object, wherein the radiation detector acquires image information of the inspection object by using radiation information detected from the X-rays and neutron beams that have passed through the inspection object, and the gamma ray detector analyzes the detected gamma ray to detect the location of the inspection object from the analysis of the inspection object and the image information.
    Type: Application
    Filed: January 28, 2020
    Publication date: June 16, 2022
    Inventors: Byeongno LEE, Kyungmin OH, Namho LEE, Moonsik CHAE, Jungho MUN, Yeongheum YEON, Jinsik JU
  • Patent number: 10705243
    Abstract: Disclosed is a nondestructive inspection system includes: a radiation source system generating different types of radiations and irradiating the generated different types of radiations toward an inspection object; a detector system detecting each of the radiations transmitted through the inspection object; a transfer system varying a position of the inspection object such that the radiations generated by the radiation source system are irradiated to the inspection object; and an image system generating an image regarding the inspection object on the basis of a detection result from the detector system, wherein the radiation source system comprises: an electron gun generating an electron beam; an electron accelerator accelerating the electron beam generated by the electron gun; and a target system selectively generating at least one of various types of radiations according to variables when the electron beam accelerated by the electron accelerator is irradiated thereto.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: July 7, 2020
    Assignee: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
    Inventors: Byeongno Lee, Soomin Lee, Namho Lee, Moonsik Chae, Jungho Mun, Kyungmin Oh, Changgoo Kang, Hansoo Kim
  • Publication number: 20190235124
    Abstract: Disclosed is a nondestructive inspection system includes: a radiation source system generating different types of radiations and irradiating the generated different types of radiations toward an inspection object; a detector system detecting each of the radiations transmitted through the inspection object; a transfer system varying a position of the inspection object such that the radiations generated by the radiation source system are irradiated to the inspection object; and an image system generating an image regarding the inspection object on the basis of a detection result from the detector system, wherein the radiation source system comprises: an electron gun generating an electron beam; an electron accelerator accelerating the electron beam generated by the electron gun; and a target system selectively generating at least one of various types of radiations according to variables when the electron beam accelerated by the electron accelerator is irradiated thereto.
    Type: Application
    Filed: January 24, 2019
    Publication date: August 1, 2019
    Applicant: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
    Inventors: Byeongno LEE, Soomin LEE, Namho LEE, Moonsik CHAE, Jungho MUN, Kyungmin OH, Changgoo KANG, Hansoo KIM