Patents by Inventor Jun-Heng You

Jun-Heng You has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in self-test circuit and built-in self-test method for physical unclonable function quality check
    Patent number: 11782090
    Abstract: A built-in self-test (BIST) circuit and a BIST method for Physical Unclonable Function (PUF) quality check are provided. The BIST circuit may include a PUF array, a readout circuit coupled to the PUF array, and a first comparing circuit coupled to the readout circuit. The PUF array may include a plurality of PUF units, wherein each of the PUF units includes a first cell and a second cell. The readout circuit may be configured to output an output bit from the first cell and output a parity bit from the second cell. The first comparing circuit may be configured to compare an output string with a parity string to generate a parity check result, wherein the output string includes output bits respectively read from selected PUF units of the PUF units, and the parity string includes parity bits read from the selected PUF units.
    Type: Grant
    Filed: August 26, 2021
    Date of Patent: October 10, 2023
    Assignee: PUFsecurity Corporation
    Inventors: Chi-Yi Shao, Kai-Hsin Chuang, Jun-Heng You, Meng-Yi Wu
  • BUILT-IN SELF-TEST CIRCUIT AND BUILT-IN SELF-TEST METHOD FOR PHYSICAL UNCLONABLE FUNCTION QUALITY CHECK
    Publication number: 20220187364
    Abstract: A built-in self-test (BIST) circuit and a BIST method for Physical Unclonable Function (PUF) quality check are provided. The BIST circuit may include a PUF array, a readout circuit coupled to the PUF array, and a first comparing circuit coupled to the readout circuit. The PUF array may include a plurality of PUF units, wherein each of the PUF units includes a first cell and a second cell. The readout circuit may be configured to output an output bit from the first cell and output a parity bit from the second cell. The first comparing circuit may be configured to compare an output string with a parity string to generate a parity check result, wherein the output string includes output bits respectively read from selected PUF units of the PUF units, and the parity string includes parity bits read from the selected PUF units.
    Type: Application
    Filed: August 26, 2021
    Publication date: June 16, 2022
    Applicant: PUFsecurity Corporation
    Inventors: Chi-Yi Shao, Kai-Hsin Chuang, Jun-Heng You, Meng-Yi Wu