Patents by Inventor Junichi Shimanuki

Junichi Shimanuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of observation by transmission electron microscopy
    Patent number: 7083992
    Abstract: A method for observing defects in an amorphous material by transmission electron microscopy. The method generates an incident electron beam into the amorphous material, eliminates a generated diffraction wave to form an image only by a transmission wave coming through the amorphous material, and observes the image under an under-focus condition.
    Type: Grant
    Filed: September 21, 2004
    Date of Patent: August 1, 2006
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Shinichi Ogawa, Yasuhide Inoue, Junichi Shimanuki, Hirotaro Mori
  • Method of observation by transmission electron microscopy
    Publication number: 20050042781
    Abstract: A method for observing defect in an amorphous material by transmission electron microscopy is disclosed. The method comprises the steps of: incident electron beam into the amorphous material; eliminating a generated diffraction wave to form an image only by a transmission wave coming through the amorphous material; and observing the image under an under-focus condition. A method for respectively observing an amorphous material and a crystalline material in a composite material containing both of the amorphous material and the crystalline material by transmission electron microscopy is also disclosed.
    Type: Application
    Filed: September 21, 2004
    Publication date: February 24, 2005
    Applicants: Semiconductor Leading Edge Technologies, Inc., NISSAN ARC, Ltd.
    Inventors: Shinichi Ogawa, Yasuhide Inoue, Junichi Shimanuki, Hirotaro Mori