Abstract: A first controller manages first mapping information for accessing data stored in a storage area, management of which is assigned to the first controller, and second mapping information for accessing data stored in a predetermined storage area, management of which is assigned to a second controller. The second controller, when having executed garbage collection on the predetermined storage area, changes mapping information to post-migration mapping information for accessing data after being migrated by the garbage collection.

Abstract: It is an object to use an additional circuit to increase speed and functioning of an existing test apparatus at a low cost. Provided is a test apparatus that is connected to a socket board corresponding to a type of device under test and tests the device under test. The test apparatus comprises a test head including therein a test module that tests the device under test; a function board that is connected to the test module in the test head via a cable and also connected to the socket board; and an additional circuit that is loaded on the function board and connected to the test module and the device under test.