Patents by Inventor Junji Kuwahara

Junji Kuwahara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe microscope
    Patent number: 8813261
    Abstract: A scanning probe microscope including: a scanning probe microscope unit section including, a cantilever having a probe, a cantilever holder configured to fix the cantilever, a sample holder on which a sample is configured to be placed, a horizontal fine transfer mechanism configured to relatively scan a surface of the sample with the probe, a vertical fine transfer mechanism configured to control a distance between the probe and the sample surface, an optical microscope configured to observe the cantilever and the sample; a control device; an imaging device to which a viewing field, wider than that of the optical microscope and capable of observing the cantilever and the sample at the same time, can be set; and an image display device configured to display images observed by the optical microscope and the imaging device.
    Type: Grant
    Filed: August 23, 2013
    Date of Patent: August 19, 2014
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Masato Iyoki, Naokatsu Nosaka, Hiroumi Momota, Junji Kuwahara
  • Scanning Probe Microscope
    Publication number: 20140059724
    Abstract: A scanning probe microscope including: a scanning probe microscope unit section including, a cantilever having a probe, a cantilever holder configured to fix the cantilever, a sample holder on which a sample is configured to be placed, a horizontal fine transfer mechanism configured to relatively scan a surface of the sample with the probe, a vertical fine transfer mechanism configured to control a distance between the probe and the sample surface, an optical microscope configured to observe the cantilever and the sample; a control device; an imaging device to which a viewing field, wider than that of the optical microscope and capable of observing the cantilever and the sample at the same time, can be set; and an image display device configured to display images observed by the optical microscope and the imaging device.
    Type: Application
    Filed: August 23, 2013
    Publication date: February 27, 2014
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Masato Iyoki, Naokatsu Nosaka, Hiroumi Momota, Junji Kuwahara