Abstract: Provided is a method for producing a beta zeolite, the method including bringing a beta zeolite parent powder synthesized without using an organic structure-directing agent into contact with an alkaline aqueous solution having a pH of 12 or higher. The liquid temperature of the alkaline aqueous solution is preferably se to 40° C. or above and 100° C. or below. The ratio of the parent powder to the alkaline aqueous solution is preferably set to 10 g/L or greater and 1000 g/L or less. The contact time is preferably 0.5 hours or longer and 48 hours or shorter. The SiO2/Al2O3 molar ratio is preferably s16 or less.

Abstract: A method for producing a zeolite with improved Si/Al according to the present invention includes the steps of: subjecting a zeolite synthesized without using an organic structure directing agent to ion exchange, thereby obtaining a sodium-type, a proton-type, or an ammonium-type zeolite; and bringing the zeolite subjected to ion exchange into contact with an ammonium salt solution, thereby dealuminating the zeolite. It is preferable that the ammonium salt is any one of ammonium oxalate, ammonium fluoride, ammonium fluorosilicate, ammonium fluoroborate, ammonium fluorophosphate, ammonium fluorotitanate, and ammonium florozirconate. It is also preferable that the zeolite after ion exchange is exposed to water vapor, and is then brought into contact with the ammonium salt solution.

Abstract: Provided is a beta zeolite satisfying P>76.79Q?29.514 in a range in which Q is less than 0.4011 nm, wherein, P represents an AB value that is an intensity ratio of A to B, A represents a diffraction intensity of a main peak of the beta zeolite observed by X-ray diffraction measurement, B represents a diffraction intensity of the (116) plane of ?-alumina obtained by X-ray diffraction measurement under the same conditions as those for the X-ray diffraction measurement on the beta zeolite, the ?-alumina being the standard substance 674a distributed by the American National Institute of Standards and Technology, and Q represents a lattice interplanar spacing of the main peak of the beta zeolite observed by X-ray diffraction measurement. It is preferable that the formula (1) above is satisfied in a range in which Q is from 0.3940 to 0.4000 nm.