Abstract: The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens.

Abstract: The present invention discloses a pin-on-disk type in-situ current-carrying friction testing system, and belongs to the technical field of friction performance testing. The friction testing system includes a pin-on-disk type friction pair, a current loading mechanism, and a magnetic field generating mechanism. The current loading mechanism includes a conductive terminal abutting against an annular sidewall of a disk specimen and used to guide a current in the disk specimen to flow along a horizontal direction, and the magnetic field generating mechanism is used to generate a magnetic field. When a pin specimen and a disk specimen rotate relatively, the pin specimen, the conductive terminal, and the magnetic field generating mechanism are relatively stationary, and an Ampere force generated by the current in the disk specimen flowing in the horizontal direction under the action of the magnetic field faces a support platform.