Patents by Inventor Junzoh Noda

Junzoh Noda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7982991
    Abstract: Embodiments of the present invention help to efficiently determine the appropriate setting of the write current of a magnetic head relative to temperature. According to one embodiment, a test computer determines the set value of a write current as a function of temperature for each head device portion from the relationship between a write current and an error rate. A test execution controller sets a selected head device portion and a write current to an AE, and writes data on a magnetic disk using the components in a HDD. The test execution controller reads the written data, and the error rate of the data from an error correcting section. The test execution controller repeats the same process with the write current varied. Upon completion of the measurement at the preset write currents, the test execution controller transfers the measurement data to the test computer.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: July 19, 2011
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Junzoh Noda, Masahiro Shimizu, Kouji Matsuda, Hiroyasu Masuda, Atsushi Tobari
  • Patent number: 7417816
    Abstract: Embodiments of the present invention provide an inspection method for detecting a physical defect of a magnetic disk with high sensitivity without increasing the length of inspection time. In a magnetic disk drive according to one embodiment, the assembling of which has been completed, by reading inspection data written to a magnetic disk, a defect of the magnetic disk is detected in a state in which a read error occurs. Redundant bits of an ECC are added to the inspection data. If a head corresponding to a recording surface to be inspected has superior read performance, an ECC 2 is applied. If the head in question has inferior read performance, an ECC 4 is applied. Accordingly, as compared with a case where a single ECC is applied, the defect detectivity is further improved without increasing the length of inspection time.
    Type: Grant
    Filed: July 11, 2005
    Date of Patent: August 26, 2008
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Masanori Aratani, Yasuhiro Iihara, Masaki Kudoh, Junzoh Noda, Masahiro Shimizu
  • Publication number: 20070273993
    Abstract: Embodiments of the present invention help to efficiently determine the appropriate setting of the write current of a magnetic head relative to temperature. According to one embodiment, a test computer determines the set value of a write current as a function of temperature for each head device portion from the relationship between a write current and an error rate. A test execution controller sets a selected head device portion and a write current to an AE, and writes data on a magnetic disk using the components in a HDD. The test execution controller reads the written data, and the error rate of the data from an error correcting section. The test execution controller repeats the same process with the write current varied. Upon completion of the measurement at the preset write currents, the test execution controller transfers the measurement data to the test computer.
    Type: Application
    Filed: May 24, 2007
    Publication date: November 29, 2007
    Applicant: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Junzoh Noda, Masahiro Shimizu, Kouji Matsuda, Hiroyasu Masuda, Atsushi Tobari
  • Publication number: 20060012906
    Abstract: Embodiments of the present invention provide an inspection method for detecting a physical defect of a magnetic disk with high sensitivity without increasing the length of inspection time. In a magnetic disk drive according to one embodiment, the assembling of which has been completed, by reading inspection data written to a magnetic disk, a defect of the magnetic disk is detected in a state in which a read error occurs. Redundant bits of an ECC are added to the inspection data. If a head corresponding to a recording surface to be inspected has superior read performance, an ECC 2 is applied. If the head in question has inferior read performance, an ECC 4 is applied. Accordingly, as compared with a case where a single ECC is applied, the defect detectivity is further improved without increasing the length of inspection time.
    Type: Application
    Filed: July 11, 2005
    Publication date: January 19, 2006
    Applicant: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Masanori Aratani, Yasuhiro Iihara, Masaki Kudoh, Junzoh Noda, Masahiro Shimizu