Patents by Inventor Jurgen Ammann

Jurgen Ammann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8508234
    Abstract: Exemplary embodiments of the present invention are directed to methods and devices for detecting open-circuit and short-circuit failure in an electromagnetic (inductive) measurement of the conductivity of liquids and on the sensor and cable wiring. An electromagnetic measurement of the conductivity of a liquid is performed by immersing a sensor into the liquid, wherein the sensor includes at least 2 toroidal cores, one of them carrying an excitation coil and the other carrying an induction coil. When an AC excitation voltage is applied to the excitation coil, an induced current or voltage can be measured in the induction coil which is proportional to the conductivity of the measured liquid.
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: August 13, 2013
    Assignee: Mettler-Toledo AG
    Inventors: Changlin Wang, Fengjin Wang, Jun Xia, Xiaokai Wang, Jürgen Ammann
  • Patent number: 8456178
    Abstract: Exemplary embodiments of the present invention include methods and devices for the electromagnetic (inductive) measurement of the conductivity of liquids by immersing a sensor into the liquid, wherein the sensor includes at least 2 toroidal cores, one of said cores carrying an excitation coil and the other core carrying an induction coil. Exemplary methods include converting the induced current at the induction coil into an alternating square-wave voltage, followed by rectification. A sample-hold circuit may be employed to avoid the transition time of the alternating square-wave current conversion. The demodulated DC voltage is proportional to the conductivity of the measured liquid.
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: June 4, 2013
    Assignee: Mettler-Toledo AG
    Inventors: Changlin Wang, Fengjin Wang, Xiaokai Wang, Jürgen Ammann
  • Publication number: 20110163756
    Abstract: Exemplary embodiments of the present invention are directed to methods and devices for detecting open-circuit and short-circuit failure in an electromagnetic (inductive) measurement of the conductivity of liquids and on the sensor and cable wiring. An electromagnetic measurement of the conductivity of a liquid is performed by immersing a sensor into the liquid, wherein the sensor includes at least 2 toroidal cores, one of them carrying an excitation coil and the other carrying an induction coil. When an AC excitation voltage is applied to the excitation coil, an induced current or voltage can be measured in the induction coil which is proportional to the conductivity of the measured liquid.
    Type: Application
    Filed: January 13, 2011
    Publication date: July 7, 2011
    Applicant: METTLER-TOLEDO AG
    Inventors: Changlin Wang, Fengjin Wang, Jun Xia, Xiaokai Wang, Jürgen Ammann
  • Publication number: 20110140717
    Abstract: Exemplary embodiments of the present invention include methods and devices for the electromagnetic (inductive) measurement of the conductivity of liquids by immersing a sensor into the liquid, wherein the sensor includes at least 2 toroidal cores, one of said cores carrying an excitation coil and the other core carrying an induction coil. Exemplary methods include converting the induced current at the induction coil into an alternating square-wave voltage, followed by rectification. A sample-hold circuit may be employed to avoid the transition time of the alternating square-wave current conversion. The demodulated DC voltage is proportional to the conductivity of the measured liquid.
    Type: Application
    Filed: January 13, 2011
    Publication date: June 16, 2011
    Applicant: METTLER-TOLEDO AG
    Inventors: Changlin Wang, Fengjin Wang, Xiaokai Wang, Jürgen Ammann
  • Patent number: 7924017
    Abstract: The measuring device has at least one measuring probe, e.g., a physical or electrochemical measuring probe, which is equipped with one or more memory units and which is connected through a cable, e.g., a coaxial cable, to a transmitter which includes a processor. The measuring probe has a ground wire and is connected to the memory unit through a first signal wire, wherein under the control of the processor in accordance with a transmission protocol, the first signal wire and a connecting cable serve for the unidirectional transmission of the analog or digital measuring signal of the measuring probe as well as the preferably bidirectional transmission between the measuring probe and the transmitter of digital operating data which are read from or to be written into the memory unit.
    Type: Grant
    Filed: February 12, 2007
    Date of Patent: April 12, 2011
    Assignee: Mettler-Toledo AG
    Inventors: Jürgen Ammann, Jiangdong Di, René Rissi, Antonio De Agostini, Klaus-Dieter Anders
  • Publication number: 20090251152
    Abstract: The condition of an electrochemical measuring probe (1) such as for example a pH-measuring probe, an oxygen-measuring probe, or a CO2-measuring probe is monitored and/or controlled. The measuring probe (1) has at least one electrode (EL) and is suitable for measuring the ion concentration of a process material (6). A charge storage device (Q2) which belongs to the electrode is charged up during a charge-up phase (TL) by means of a charge transfer that can be controlled by a controller unit (CU). During a subsequent test phase (TT) the resultant electrode voltage (UE) is measured at least once, and the result of the measurement is processed further.
    Type: Application
    Filed: June 18, 2009
    Publication date: October 8, 2009
    Applicant: Mettler-Toledo AG
    Inventor: Jurgen Ammann
  • Patent number: 7290434
    Abstract: An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: November 6, 2007
    Assignee: Mettler-Toledo AG
    Inventors: Jürgen Ammann, Alfred Peer, René Oberlin, Klaus-Dieter Anders, Christian Zwicky
  • Publication number: 20070214872
    Abstract: The measuring device has at least one measuring probe, e.g., a physical or electrochemical measuring probe, which is equipped with one or more memory units and which is connected through a cable, e.g., a coaxial cable, to a transmitter which includes a processor. The measuring probe has a ground wire and is connected to the memory unit through a first signal wire, wherein under the control of the processor in accordance with a transmission protocol, the first signal wire and a connecting cable serve for the unidirectional transmission of the analog or digital measuring signal of the measuring probe as well as the preferably bidirectional transmission between the measuring probe and the transmitter of digital operating data which are read from or to be written into the memory unit.
    Type: Application
    Filed: February 12, 2007
    Publication date: September 20, 2007
    Applicant: Mettler-Toledo AG
    Inventors: Jurgen Ammann, Jiangdong Di, Rene Rissi, Antonio De Agostini, Klaus-Dieter Anders
  • Publication number: 20050166660
    Abstract: An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.
    Type: Application
    Filed: December 22, 2004
    Publication date: August 4, 2005
    Inventors: Jurgen Ammann, Alfred Peer, Rene Oberlin, Klaus-Dieter Anders, Christian Zwicky
  • Patent number: 6856930
    Abstract: A potentiometric measuring probe contains an electrolyte (110) as well as a primary reference element (106) and a secondary reference element (108) that are arranged so that the front (148) of an electrolyte deficiency advancing from an opening (112) of the measuring probe arrives at the secondary reference element before it arrives at the primary reference element. The potential difference existing between the primary reference element and the secondary reference element is monitored, and when a predefined tolerance criterion is found to be violated, the elapsed operating time from the point when the measuring probe was put into operation is determined and used as a basis for calculating the remaining operating time of the measuring probe.
    Type: Grant
    Filed: July 2, 2003
    Date of Patent: February 15, 2005
    Assignee: Mettler-Toledo GmbH
    Inventor: Jürgen Ammann
  • Publication number: 20040068385
    Abstract: A potentiometric measuring probe contains an electrolyte (110) as well as a primary reference element (106) and a secondary reference element (108) that are arranged so that the front (148) of an electrolyte deficiency advancing from an opening (112) of the measuring probe arrives at the secondary reference element before it arrives at the primary reference element. The potential difference existing between the primary reference element and the secondary reference element is monitored, and when a predefined tolerance criterion is found to be violated, the elapsed operating time from the point when the measuring probe was put into operation is determined and used as a basis for calculating the remaining operating time of the measuring probe.
    Type: Application
    Filed: July 2, 2003
    Publication date: April 8, 2004
    Applicant: Mettler-Toledo GmbH
    Inventor: Jurgen Ammann