Patents by Inventor Jurgen Kaufmann

Jurgen Kaufmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10156504
    Abstract: An apparatus for optical in-situ gas analysis includes: a housing; a measuring lance a first end connected to the housing and a second end projecting into the gas to be measured; a light transmitter that is arranged in the housing and whose light is conducted into the measuring lance and is reflected by a reflector arranged at the second end onto a light receiver, and the optical path defines an optical measurement path within the measuring lance; and, an evaluation device for evaluating received light signals of the light receiver. In order to be able to reduce the consumption of test gas, the measuring lance has an outer tube, with the outer tube having openings for the gas to be measured. The openings can be closed by at least one seal for the test phase, with the seal searingly closing the openings by the enlargement of its volume.
    Type: Grant
    Filed: April 11, 2017
    Date of Patent: December 18, 2018
    Assignee: SICK AG
    Inventors: Florian Brüchig, Ingo Schiffler, Jürgen Kaufmann
  • Publication number: 20170299484
    Abstract: An apparatus for optical in-situ gas analysis includes: a housing; a measuring lance a first end connected to the housing and a second end projecting into the gas to be measured; a light transmitter that is arranged in the housing and whose light is conducted into the measuring lance and is reflected by a reflector arranged at the second end onto a light receiver, and the optical path defines an optical measurement path within the measuring lance; and, an evaluation device for evaluating received light signals of the light receiver. In order to be able to reduce the consumption of test gas, the measuring lance has an outer tube, with the outer tube having openings for the gas to be measured. The openings can be closed by at least one seal for the test phase, with the seal searingly closing the openings by the enlargement of its volume.
    Type: Application
    Filed: April 11, 2017
    Publication date: October 19, 2017
    Inventors: Florian BRÜCHIG, Ingo SCHIFFLER, Jürgen KAUFMANN
  • Patent number: 9074930
    Abstract: A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26).
    Type: Grant
    Filed: March 20, 2014
    Date of Patent: July 7, 2015
    Assignee: Sick AG
    Inventors: Jurgen Kaufmann, Thomas Beyer, Julian Edler
  • Publication number: 20140299774
    Abstract: A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26).
    Type: Application
    Filed: March 20, 2014
    Publication date: October 9, 2014
    Applicant: SICK AG
    Inventors: Jurgen KAUFMANN, Thomas BEYER, Julian EDLER
  • Patent number: 8749788
    Abstract: The invention relates to an improved optoelectronic apparatus for optical gas analysis by means of which the interfering influence of the particles contained in the gas is reduced with regard to the intended measurement. For this purpose the optoelectronic apparatus in accordance with the invention has a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another. The received signals of the light receiver can be evaluated in an evaluation unit, to ultimately obtain the desired information therefrom, for example, the concentration of a specific gas content. In accordance with the invention an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the undesirable particles, i.e. e.g. the dust particles, smoke particles or such like aerosols so that the ionized particles can be deflected by electric fields or also magnetic fields by means of an ion acceleration apparatus.
    Type: Grant
    Filed: May 31, 2011
    Date of Patent: June 10, 2014
    Assignee: Sick AG
    Inventors: Jürgen Kaufmann, Frank Nuber, Michael Overdick, Rolf Schiffler
  • Publication number: 20120002205
    Abstract: The invention relates to an improved optoelectronic apparatus for optical gas analysis by means of which the interfering influence of the particles contained in the gas is reduced with regard to the intended measurement. For this purpose the optoelectronic apparatus in accordance with the invention has a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another. The received signals of the light receiver can be evaluated in an evaluation unit, to ultimately obtain the desired information therefrom, for example, the concentration of a specific gas content. In accordance with the invention an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the undesirable particles, i.e. e.g. the dust particles, smoke particles or such like aerosols so that the ionized particles can be deflected by electric fields or also magnetic fields by means of an ion acceleration apparatus.
    Type: Application
    Filed: May 31, 2011
    Publication date: January 5, 2012
    Applicant: SICK MAIHAK GmbH
    Inventors: Jürgen KAUFMANN, Frank NUBER, Michael OVERDICK, Rolf SCHIFFLER
  • Publication number: 20080279726
    Abstract: The invention relates to a cuvette (10, 10?) having a chamber (20, 20?) which is closed by windows at the end faces and having an HF reservoir, wherein an HF resistant, porous material (30, 30?) is arranged as the HF reservoir in the chamber (20, 20?).
    Type: Application
    Filed: May 8, 2008
    Publication date: November 13, 2008
    Applicant: SICK MAIHAK GmbH
    Inventors: Jurgen Kaufmann, Dieter Sommer, Thomas Beyer, Gerhard Meier
  • Patent number: 6885453
    Abstract: A gas permeable probe for use in an optical analyzer for an exhaust gas stream flowing through a duct or chimney has: an elongate hollow structure having first and second ends and a side wall, with an optical cavity defined between the first and second ends within the side wall, a filter forming part of the elongate hollow structure, a mounting structure at the first end and adapted for mounting the elongate hollow structure within the duct or chimney, an optical window at the first end permitting a light beam originating from an optical analyzer to enter into the optical cavity to travel from the first end to the second end, a retroreflector provided at the second end for returning the light beam to the first end of the hollow structure, and a tube disposed within the mounting structure and having first and second opposite ends, the first opposite end being located remote from the first end of the elongate hollow structure and being closed by a first window adapted to transmit the light beam from an optic
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: April 26, 2005
    Assignee: Sick AG
    Inventor: Jürgen Kaufmann
  • Patent number: 6809825
    Abstract: A gas permeable probe for use in an optical analyzer for an exhaust gas stream flowing through a duct or chimney has: an elongate hollow structure having first and second ends and a side wall, with an optical cavity defined between the first and second ends within the side wall, a mounting structure at the first end and adapted for mounting the elongate hollow structure within the duct or chimney, a support member at the second end, a connecting structure connecting the mounting structure at the first end to the support member at the second end, an optical window at the first end permitting a beam of light originating from an optical analyzer to enter into the optical cavity to travel from the first end to the second end, a filter forming a part of the side wall, and a retroreflector provided at the second end for returning the light beam to the first end of the hollow structure, the optical window being releasably mounted at the first end of the elongate hollow structure and/or the retroreflector bei
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: October 26, 2004
    Assignee: Sick AG
    Inventor: Jürgen Kaufmann
  • Publication number: 20030090665
    Abstract: A gas permeable probe for use in an optical analyzer for an exhaust gas stream flowing through a duct or chimney comprises:
    Type: Application
    Filed: November 13, 2001
    Publication date: May 15, 2003
    Applicant: SICK AG
    Inventor: Jurgen Kaufmann
  • Patent number: 5781306
    Abstract: A spectrometric gas measurement apparatus for the determination of the presence and/or concentration of gases in a spatial region has a spectrometric measurement head which transmits into the spatial region measurement radiation having the spectral ranges necessary for the determination of the gases. Furthermore, a reflector is provided at the spatial region which reflects the light which is passed through at least a part of the spatial region back to the measurement head where it is split up spectrally in an analyzer and then supplied to a photoreceiver arrangement. A measurement tube extending in the direction of light propagation is provided in the spatial region through which the measurement light passes.
    Type: Grant
    Filed: November 30, 1995
    Date of Patent: July 14, 1998
    Assignee: Erwin Sick GmbH Optik-Elektronik
    Inventors: Wolfgang Hartig, Jurgen Kaufmann
  • Patent number: 4794258
    Abstract: A spectroanalytical gas measuring apparatus has a radiation source (36), a transmitting condensor (19), an objective (13) and a beam divider (11) which deflects at least a part of the radiation reflected back to the apparatus by a reflector (40) to a polychromator or spectrometer (32). The transmitted radiation falls after the beam divider (11) onto a deflecting mirror (12) which is adjustable between two positions and which directs the light to an objective reflector (13). The objective reflector (13) reflects the radiation to a follow-up mirror (15) arranged opposite to the beam passage opening (14). At least one long and one short focal length objective reflector (13) are provided in order to ensure different ranges of distance in conjunction with the adjustable deflecting mirror (12).
    Type: Grant
    Filed: June 24, 1987
    Date of Patent: December 27, 1988
    Assignee: Erwin Sick GmbH Optik-Elektronik
    Inventors: Gunter Fetzer, Jurgen Kaufmann, Hans-Jurgen Schneider, Frank Strohbusch