Abstract: System and method for implementing a memory test language compiler. The compiler includes a fast semantic processor for interpreting programming patterns in a test program, including converting stateful patterns into stateless patterns, and a device access timing generation module for generating an output based on the stateless patterns. The fast semantic processor can generate a closure for a device access line as the output. In the state of the closure, each device access line is in a closed state. A functor is formed from the interdependency of the variables and the loop dependency and a cache is used to handle recursive variables. The functor is propagated to device access lines as output, wherein the functor references the cache when needed.