Patents by Inventor Justin E. Patterson

Justin E. Patterson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230057479
    Abstract: A device for generating waveforms includes a machine learning system configured to associate waveforms from a device under test to parameters, a user interface configured to allow a user to provide one or more user inputs, and one or more processors configured to execute code that causes the one or more processors to receive one or more inputs through the user interface that include one or more parameters, apply the machine learning system to the received one or more parameters, produce, by the machine learning system, a waveform based on the one or more parameters, and output the produced waveform. Methods of generating waveforms are also presented.
    Type: Application
    Filed: August 22, 2022
    Publication date: February 23, 2023
    Inventors: John J. Pickerd, Justin E. Patterson, Heike Tritschler
  • Publication number: 20230019734
    Abstract: A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display.
    Type: Application
    Filed: July 11, 2022
    Publication date: January 19, 2023
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Justin E. Patterson
  • Publication number: 20220390515
    Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.
    Type: Application
    Filed: June 2, 2022
    Publication date: December 8, 2022
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Mark Anderson Smith, Kan Tan, Evan Douglas Smith, Justin E. Patterson, Heike Tritschler