Abstract: A testing system including a plurality of ports, at least one controller, and a programmable memory. The plurality of ports may be adapted to implement an IEEE 1149.x standard interface. The at least one controller may be in electronic communication with at least one of the plurality of ports. The programmable memory may be in electrical communication with the at least one controller and adapted to store at least one clock forming variable. The at least one controller may be adapted to form an IEEE 1149.x clock signal for at least one of the plurality of ports based on the at least one clock forming variable. The at least one controller controls the IEEE 1149.x clock signal for at least one of the plurality of ports independently of the IEEE 1149.x clock signal for any other of the plurality of ports.

Abstract: A testing system including a plurality of ports, at least one controller, and a programmable memory. The plurality of ports may be adapted to implement an IEEE 1149.x standard interface. The at least one controller may be in electronic communication with at least one of the plurality of ports. The programmable memory may be in electrical communication with the at least one controller and adapted to store at least one clock forming variable. The at least one controller may be adapted to form an IEEE 1149.x clock signal for at least one of the plurality of ports based on the at least one clock forming variable. The at least one controller controls the IEEE 1149.x clock signal for at least one of the plurality of ports independently of the IEEE 1149.x clock signal for any other of the plurality of ports.

Abstract: Fault detection optimized electronic circuit includes a circuit substrate on which components of the electronic circuit are respectively disposed. Each of the components has a component body which includes at least a first and second contacts. A component trace formed of conductive material is disposed on a first exterior surface of each component body facing the substrate. The component trace is electrically insulated from the first and second contact. Each of the components contains a network consisting of at least two capacitors connected in series between the first and second contact. A test point is formed of conductive material disposed on a second exterior surface of each body. The test point is electrically isolated from the first and second contacts and electrically connected to at least the component trace.

Abstract: Fault detection optimized electronic circuit includes a circuit substrate on which components of the electronic circuit are respectively disposed. Each of the components has a component body which includes at least a first and second contacts. A component trace formed of conductive material is disposed on a first exterior surface of each component body facing the substrate. The component trace is electrically insulated from the first and second contact. Each of the components contains a network consisting of at least two capacitors connected in series between the first and second contact. A test point is formed of conductive material disposed on a second exterior surface of each body. The test point is electrically isolated from the first and second contacts and electrically connected to at least the component trace.