Patents by Inventor Justin Taraska

Justin Taraska has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10914933
    Abstract: Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.
    Type: Grant
    Filed: September 4, 2019
    Date of Patent: February 9, 2021
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY, DEPARTMENT OF HEALTH AND HUMAN SERVICES
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • Publication number: 20200064611
    Abstract: Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.
    Type: Application
    Filed: September 4, 2019
    Publication date: February 27, 2020
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • Patent number: 10520714
    Abstract: Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: December 31, 2019
    Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • Publication number: 20190179128
    Abstract: Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.
    Type: Application
    Filed: August 23, 2017
    Publication date: June 13, 2019
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo