Patents by Inventor Jye Geoffrey Smith

Jye Geoffrey Smith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Impedance measurement process
    Patent number: 10070800
    Abstract: A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: September 11, 2018
    Assignee: IMPEDIMED LIMITED
    Inventors: Bruce Herbert Cornish, Brian John Thomas, Jye Geoffrey Smith
  • Impedance Measurement Process
    Publication number: 20160089051
    Abstract: A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
    Type: Application
    Filed: December 8, 2015
    Publication date: March 31, 2016
    Applicant: Impedimed Limited
    Inventors: Bruce Herbert CORNISH, Brian John THOMAS, Jye Geoffrey SMITH
  • Impedance measurement process
    Publication number: 20110046505
    Abstract: A method for use in performing impedance measurements on a subject. The method includes, in a processing system, determining at least one first impedance value, measured at a site using a first electrode configuration, determining at least one second impedance value, measured at the site using a second electrode configuration, and determining the presence, absence or degree of an anomaly using the first and second impedance values.
    Type: Application
    Filed: August 7, 2008
    Publication date: February 24, 2011
    Applicant: IMPEDIMED LIMITED
    Inventors: Bruce Herbert Cornish, Brian John Thomas, Jye Geoffrey Smith