Patents by Inventor Jyh-J Huang

Jyh-J Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6333261
    Abstract: A semiconductor wafer includes a substrate, an aluminum layer on the substrate, an anti-reflection coating on the aluminum layer, a dielectric layer on the anti-reflection coating, and a via hole that passes through the dielectric layer and the anti-reflection coating down to a predetermined depth within the aluminum layer. A titanium layer is formed on the bottom and on the walls of the via hole. A physical vapor deposition process is then performed to form a first titanium nitride layer on the titanium layer. A chemical vapor deposition process is then performed to form a second titanium nitride layer on the first titanium nitride layer.
    Type: Grant
    Filed: June 1, 2000
    Date of Patent: December 25, 2001
    Assignee: United Microelectronics Corp.
    Inventors: Chi-Jung Lin, Jyh-J Huang, Horng-Bor Lu, Kun-Lin Wu