Patents by Inventor Jyun-Jia Yang

Jyun-Jia Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8111405
    Abstract: An automatic scan and mark apparatus has a machine tool, a location detection module, a laser detector, an ink jet and a control computer. The machine tool has a movable module and a stage. The stage mounts and holds a specimen having a scraped surface. The control computer controls the location detection module to determine a position of the movable module, controls the laser detector to detect a surface morphology of the scraped surface in a measurement range, and activates the ink jet to eject inks on high points of the scraped surface of the specimen. Thus, the surface morphology is built automatically and high points are screened out and marked by colored ink. Manufacturer may easily redo scraping of determined high points based on the marked location on the specimen without burdensome measurement.
    Type: Grant
    Filed: August 26, 2009
    Date of Patent: February 7, 2012
    Assignee: National Formosa University
    Inventors: Wen-Yuh Jywe, Chien-Hung Liu, Hung-Shu Wang, Bo-Wei Chen, Jyun-Jia Yang, Wei-Cheng Tsai, Wei-Chung Chang, Ming-Chi Chiang, Jia-Hong Chen
  • Publication number: 20110050771
    Abstract: An automatic scan and mark apparatus has a machine tool, a location detection module, a laser detector, an ink jet and a control computer. The machine tool has a movable module and a stage. The stage mounts and holds a specimen having a scraped surface. The control computer controls the location detection module to determine a position of the movable module, controls the laser detector to detect a surface morphology of the scraped surface in a measurement range, and activates the ink jet to eject inks on high points of the scraped surface of the specimen. Thus, the surface morphology is built automatically and high points are screened out and marked by colored ink. Manufacturer may easily redo scraping of determined high points based on the marked location on the specimen without burdensome measurement.
    Type: Application
    Filed: August 26, 2009
    Publication date: March 3, 2011
    Inventors: Wen-Yuh Jywe, Chien-Hung Liu, Hung-Shu Wang, Bo-Wei Chen, Jyun-Jia Yang, Wei-Cheng Tsai, Wei-Chung Chang, Ming-Chi Chiang, Jia-Hong Chen