Patents by Inventor Jyunpei Maruyama

Jyunpei Maruyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7770232
    Abstract: A scanning probe microscope system capable of identifying an element with atomic scale spatial resolution comprises: an X-ray irradiation means for irradiating a measurement object with high-brilliance monochromatic X-rays having a beam diameter smaller than 1 mm; a probe arranged to oppose to the measurement object; a processing means for detecting and processing a tunneling current through the probe; and a scanning probe microscope having an alignment means for relatively moving the measurement object, the probe, and the incident position of the high-brilliance monochromatic X-rays to the measurement object.
    Type: Grant
    Filed: March 16, 2006
    Date of Patent: August 3, 2010
    Assignee: Riken
    Inventors: Akira Saito, Masakazu Aono, Yuji Kuwahara, Jyunpei Maruyama, Ken Manabe
  • Publication number: 20080258059
    Abstract: A scanning probe microscope system capable of identifying an element with atomic scale spatial resolution comprises: an X-ray irradiation means for irradiating a measurement object with high-brilliance monochromatic X-rays having a beam diameter smaller than 1 mm; a probe arranged to oppose to the measurement object; a processing means for detecting and processing a tunneling current through the probe; and a scanning probe microscope having an alignment means for relatively moving the measurement object, the probe, and the incident position of the high-brilliance monochromatic X-rays to the measurement object.
    Type: Application
    Filed: March 16, 2006
    Publication date: October 23, 2008
    Applicant: RIKEN
    Inventors: Akira Saito, Masakazu Aono, Yuji Kuwahara, Jyunpei Maruyama, Ken Manabe