Abstract: A device for controlling data-reading and -writing includes a memory controller. The memory controller controls the reading and writing of a memory, wherein the memory includes at least a first physical block and a second physical block. The memory controller, upon receives a write request for a data block, duplicately writes mapped data corresponding to data of the data block into mapped positions corresponding to the first physical block and the second physical block according to the write request. The memory controller, upon receives a read request for the data block, selects to read the mapped data corresponding to the data of the data block from the first physical block or the second physical block corresponding to the mapped position according to the read request and a reading condition, to continuously output the data of the data block stored in the memory.

Abstract: An exposing method adapted to a maskless photolithography process. The exposing method includes reading an exposure file; obtaining a plurality of coordinate information corresponding to a plurality of patterns contained in the exposure file, according to the exposure file; generating graphical data, according to the plurality of coordinate information; generating scanning data corresponding to each of a plurality of polygon mirrors or each of at least one polygon mirror group, according to the graphical data and a configuration of the polygon mirrors, wherein every two rotation directions of every two adjacent polygon mirrors of the plurality of polygon mirrors are different, or every two rotation directions of every two adjacent polygon mirrors of the at least one polygon mirror group are different.

Abstract: An exposing method adapted to a maskless photolithography process. The exposing method includes reading an exposure file; obtaining a plurality of coordinate information corresponding to a plurality of patterns contained in the exposure file, according to the exposure file; generating graphical data, according to the plurality of coordinate information; generating scanning data corresponding to each of a plurality of polygon mirrors or each of at least one polygon mirror group, according to the graphical data and a configuration of the polygon mirrors, wherein every two rotation directions of every two adjacent polygon mirrors of the plurality of polygon mirrors are different, or every two rotation directions of every two adjacent polygon mirrors of the at least one polygon mirror group are different.

Abstract: A pixel array module with a self-test function including a test circuit unit, a plurality of test lines, and a pixel array is provided. The test circuit unit provides the self-test function. The test lines are connected between the test circuit unit and the pixel array. The pixel array is connected to the test circuit unit through the test lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminal and a second terminal. Regarding each of the pixels, a driving signal of the transistor is transmitted from the first terminal to the second terminal thereof under a normal mode, and a test signal of the transistor is transmitted from the second terminal to the first terminal thereof under a test mode. Furthermore, a self-test method of the foregoing pixel array module is also provided.

Abstract: The disclosure provides an interposer testing device for testing an interposer and a method thereof which includes a heat source, a thermal image capturing device and a comparing device. The heat source is adapted for heating an area to be tested on the interposer. The thermal image capturing device is adapted for capturing a thermal image of the interposer after the interposer is heated. The comparing device is adapted for comparing the thermal image with a standard thermal image to output a comparison result.

Abstract: An image pickup apparatus and a method thereof are provided. The apparatus includes a sensor array and an ADC array. The sensor array includes M×N sensor blocks SB(i,j). The sensor block includes P×Q image sensing elements Se(x,y). The ADC array is located at another side of the illuminated side of the sensor array. The ADC array includes M×N ADCs ADC(i,j). The ADC(i,j) coupled to the sensor block SB(i,j) obtains the image data Data(x,y) from the image sensing element Se(x,y) of the sensor block SB(i,j). The ADC(i,j) evaluates the gain G(x,y) based on the position of the image sensing element Se(x,y). The compensated image data Datacom(x,y) can be outputted and Datacom(x,y)=Data(x,y)×G(x,y). The image pickup apparatus could improve the optical shading problem.

Abstract: A pixel array module with a self-test function including a test circuit unit, a plurality of test lines, and a pixel array is provided. The test circuit unit provides the self-test function. The test lines are connected between the test circuit unit and the pixel array. The pixel array is connected to the test circuit unit through the test lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminal and a second terminal. Regarding each of the pixels, a driving signal of the transistor is transmitted from the first terminal to the second terminal thereof under a normal mode, and a test signal of the transistor is transmitted from the second terminal to the first terminal thereof under a test mode. Furthermore, a self-test method of the foregoing pixel array module is also provided.

Abstract: An image sensor including a pixel array is provided. The pixel array includes R×S sub-pixel arrays. The sub-pixel array includes P×Q pixels. Each pixel includes a photodiode, a first transistor, a second transistor, a third transistor, a fourth transistor, and a fifth transistor. The gate of the second transistor is coupled to a row control signal. The second source/drain electrode of the second transistor is coupled to a column control signal. The gate electrode of the third transistor is coupled to a reset signal. The second source/drain electrode of the third transistor is coupled to a column voltage reset signal. The gate electrode of the fifth transistor is coupled to a row select signal. The sub-pixel array uses the row control signal, the column control signal, the column voltage reset signal, and the row select signal to select an output the sensing signal of one of the pixels.

Abstract: An image pickup apparatus and a method thereof are provided. The apparatus includes a sensor array and an ADC array. The sensor array includes M×N sensor blocks SB(i,j). The sensor block includes P×Q image sensing elements Se(x,y). The ADC array is located at another side of the illuminated side of the sensor array. The ADC array includes M×N ADCs ADC(i,j). The ADC(i,j) coupled to the sensor block SB(i,j) obtains the image data Data(x,y) from the image sensing element Se(x,y) of the sensor block SB(i,j). The ADC(i,j) evaluates the gain G(x,y) based on the position of the image sensing element Se(x,y). The compensated image data Datacom(x,y) can be outputted and Datacom(x,y)=Data(x,y)×G(x,y). The image pickup apparatus could improve the optical shading problem.

Abstract: An image capture apparatus comprises an image sensor array including a plurality of image sensors arranged in a two-dimensional (2-D) array and an analog-to-digital converter (ADC) array including a plurality of ADCs arranged in a 2-D array. The image sensor array is divided into a plurality of sub-arrays, each of which includes at least two image sensors. The image sensor array is vertically stacked on the ADC array. Each ADC corresponds to one sub-array of image sensors and is coupled to process signals output by the image sensors in the corresponding sub-array.